|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Fluke unites its calibration product groups under a new brand
21 July 2010 - Fluke Corporation announced it is consolidating its six calibration product lines under a single logo - Fluke Calibration. The change represents the unification of Fluke Calibration’s measurement disciplines, including electrical, RF, temperature, pressure, flow, and calibration software.
Desktop RF diagnostic chamber
21 July 2010 - The compact R&S DST200 RF diagnostic chamber of Rohde & Schwarz makes it easy for developers of wireless devices such as mobile phones to perform reproducible radiated RF measurements on the workbench. The benchtop chamber simulates conditions that approximate free space and features a 700 MHz to 6 GHz broadband test antenna especially designed for the chamber.
National Instruments expands Embedded Vision System Offerings
20 July 2010 – National Instruments today announced the addition of Windows OS support and Camera Link connectivity for NI Embedded Vision Systems, providing manufacturing engineers and system integrators three new options to develop high-performance machine vision solutions.
Vi TECHNOLOGY launches the REVEAL Imager AOI Series
14 July 2010 – Vi TECHNOLOGY introduces the REVEAL Imager Series, at SEMICON West 2010 from July 13th to 15th, Booth 5377 - North Hall – San Francisco Moscone Center. Along with the product an automatic JEDEC Tray loader compatible with both REVEAL Imager and REVEAL MEMS Series will be demonstrated.
Orpro Vision appoints distributor for Czech Republic and Slovakia
12 July 2010 - ORPRO Vision GmbH, a manufacturer of AOI systems for the global electronics industry, has appointed Elmatest as distributor for Czech Republic and Slovakia to consolidate its presence in Europe.
Optical Inspection System for Automated Conformal Coat Inspection
05 July 2010 - GOEPEL electronic offers a system for the automated optical inspection of fluorescing conformal coating. The TOM system (Teachable Optical Measurement) can be utilised for inspection of PCB coatings as well as PCB areas, which mustn’t be coated. The maximum PCB size is 460 X 400 mm.
Direct-ProbeTM Solution for Verigy V93000
02 July 2010 - Verigy has extended the scalability of its production-proven V93000 platform by adding the Direct-Probe™ solution. This high-performance probe test capability for digital, mixed-signal and wireless communication ICs delivers one of the highest signal integrity levels available for production-volume, multi-site probe testing.
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Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
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