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Advantest enters Market for Test of Protocol-Based Flash Storage29 July 2013 - Advantest has entered the market for testing advanced PCI Express (PCIe) 3.0 NVMe solid-state drives (SSDs) for enterprise and consumer applications with the versatile NEO-SSD platform, on which the company is building a family of test solutions that are scheduled to begin shipping to customers in the fourth quarter of this calendar year.
High-end Test Platform for Broadcast Equipment29 July 2013 - The new R&S BTC broadcast test center from Rohde & Schwarz provides a complete testing environment for nearly all audio, video and multimedia applications – in a single device. The RF reference signal generator generates RF signals for all global TV and broadcasting standards and simulates transmissions. The generator can also internally analyze the audio/video functions of DUTs in realtime. The modular design provides a high degree of scalability, allowing the R&S BTC to be configured for any customer requirement. KLA-Tencor enhances its Defect Inspection and Review Portfolio26 July 2013 - KLA-Tencor announced the new 2910 Series optical wafer defect inspection platform with NanoPoint technology and the new eDR-7100 electron-beam wafer defect review system. Meeting IC manufacturers' need for accelerated defect sourcing on advanced devices, these two tools combine increased speed with seamless connectivity to quickly find and identify defects that inhibit yield and reliability.
Video Camera and Image Test System25 July 2013 - Leader Instruments announced a new addition to its product range, the FS8681 video camera image inspection and evaluation system. Designed for use in conjunction with a standard PC, the FS8681 allows efficient checking of characteristics such as image distortion, chroma phase and saturation, tonal characteristics, resolution, signal-to-noise-ratio and pixel-related defects.
Tektronix expands Performance Mixed Signal Oscilloscope Family25 July 2013 – Tektronix introduced the new MSO/DPO70000DX Series of performance oscilloscopes that feature models with 23GHz, 25GHz, and 33GHz bandwidth and enhanced tools for debugging digital and analog circuits. The company also announced the world’s fastest and lowest noise oscilloscope probe with 33GHz bandwidth and industry leading sensitivity for low-voltage, high-speed serial and RF signals.
DDC expands MIL-STD-1553 Product Offering with Acquisition of NHi Product Line24 July 2013 - Data Device Corporation (DDC) announced that it has expanded its MIL-STD-1553 data bus product offering with the acquisition of the National Hybrid data bus product line from API Technologies. The data bus product line includes National Hybrid-brand products and UK-made MIL- STD-1553 and MIL-STD-1760 products. Online Quoting Tool for RF Probes24 July 2013 - Cascade Microtech launched a new dynamic online tool for selecting, comparing and quoting probes from a wide variety of RF frequencies and pitches for different applications and device types. Responding to customers’ needs to quickly find a probe that meets their requirements, Cascade Microtech has developed an online selection tool for its most popular RF probes. More Articles ...
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