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Readers Top 5 News of last 30 days
News - Board and System TestMonitoring the Battery Life of Wireless Devices21 March 2017 - The new R&S RT-ZVC multichannel power probe of Rohde & Schwarz, in combination with an R&S CMW radio communication tester, monitors the power consumption of chipsets, radio modules and mobile devices. It is the only solution available on the market that can correlate battery consumption data with RF signaling events. And it accomplishes this with a measurement resolution of 18 bits, making measurements in the nanoampere range possible. XJTAG DFT for Mentor Graphics PADS20 March 2017 – XJTAG developed a free software for PADS Schematic Design which will significantly increase the Design for Test and Debug capabilities of the schematic capture and PCB design environment. The XJTAG DFT Assistant comprises the XJTAG Chain Checker and the XJTAG Access Viewer. One-Box Test Solution for LoRa Measurement17 March 2017 – Anritsu demonstrated its testing capabilities for LoRa devices for R&D and Manufacturing at Mobile World Congress. In a joint collaboration with IMST, Anritsu demonstrated its preliminary version of a LoRa test measurement suite including RF transmitter and receiver tests of LoRa devices for production lines. The demonstration of the first one-box test solution for LoRa measurements will be done using the Anritsu MT8870A Universal Wireless Test Set and the IMST LoRa module iM880B-L, a LoRa Alliance certified product. Debugging and Trace of various Multicore Microcontrollers13 March 2017 - PLS Programmierbare Logik & Systeme launched its new Universal Access Device 2next (UAD2next). The UAD2next is a powerful and extremely versatile access device for fast on-chip debugging and trace of various multicore microcontrollers in deeply embedded systems. The UAD2next acts as a bridge between the base model UAD2pro and the high-end tool UAD3+. Besides a large number of powerful debug and trace interfaces, such as DAP, SWD, JTAG, cJTAG and LPD, the UAD2next also supports CAN and ASC interfaces for access to the target. Measurement Software for 4.5G Test09 March 2017 – National Instruments (NI) announced NI-RFmx 2.2, the latest version of its advanced measurement software for PXI RF test systems. When used with the second-generation PXI Vector Signal Transceiver (VST), engineers can test 4.5G and 5G RF components such as transceivers and amplifiers using a wide range of carrier aggregation schemes, even as the 5G standard is still being defined. Bluetooth Conformance Test07 March 2017 – Teledyne LeCroy announced a Bluetooth Conformance Tester for verifying conformance of Bluetooth low energy link layer and HCI implementations. The Teledyne Bluetooth Conformance Tester dramatically simplifies the testing and reporting of Bluetooth low energy implementations attempting to conform to the Bluetooth 4.1, 4.2, and 5 specifications published by the Bluetooth Special Interest Group (Bluetooth SIG). All-in-One BERTWave Tester for 100-Gbit/s Multi-Channel Optical Modules06 March 2017 – Anritsu launched the new BERTWave MP2110A series which is optimized for manufacturing inspection of 100-Gbit/s multi-channel optical modules. The newly added BERTWave MP2110A is an all-in-one instrument targeted at simultaneous BER (Bit Error Rate) measurements and Eye Pattern Analysis required for evaluation of optical modules and devices used in optical communications systems, including 100 GbE, InfiniBand EDR and 32G Fibre Channel. More Articles ...
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