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AOI Camera Module for extreme Cycle Times and highest Inspection Depth
05 April 2013 – Viscom has developed a totally new camera module for its automatic optical inspection (AOI) systems. The new XM camera module will be introduced mid of April on the trade fair SMT in Nuremberg, Germany. With an image capture rate of up to 1.8 gigapixel/sec, the new XM module is the fastest AOI camera system on the market. The XM module is a completely proprietary development from the company, combining more than 25 years' experience in inspection technology.
As the essential heart of an AOI system, camera modules are decisive for throughput and inspection depth during assembly inspection.
With four-color illumination from all spatial directions, optimum contrast is achieved for all recognizable solder defects as well as for special effects such as script, polarity marks or colored components. Therefore, defects are reliably detected even with critical surface and reflection conditions on the electronic assembly.
With a switchable optical resolution of 16 or 8 µm, the high performance module can handle the most extreme throughput requirements.
Due to the extremely fast inspection speed with very homogeneous illumination and high resolution, the inspection can be even better targeted to the respective electronic assembly. Extension of the angled view, capture of additional images for the verification station, and additional illuminations are nearly cycle time-neutral, so the operator has even greater flexibility in the inspection concept. This increases the inspection depth and first-pass yield without exceeding predetermined cycle times.
Of course, the XM module commands the typical Viscom angled view. The most demanding assembly layouts, including 01005 components, also can be reliably inspected. The new XM module is available for the S6056 as of now. Viscom customers benefit from the 8M compatibility mode. This function guarantees that to a great extent, already existing inspection patterns and complete libraries can be taken over with no changes.
Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
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