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PXI-based Wireless Test System optimized for Throughput in Production

NI WTS14 August 2015 - National Instruments (NI) released the Wireless Test System (WTS), a solution that is aimed to lower the cost of high-volume wireless manufacturing test. The WTS combines the latest advances in PXI hardware to offer a single platform for multi-standard, multi-DUT and multi-port testing. When used with flexible test sequencing software, such as the TestStand Wireless Test Module, manufacturers can significantly improve instrument utilization when testing multiple devices in parallel.

The WTS integrates easily into a manufacturing line with ready-to-run test sequences for devices that use chipsets from suppliers like Qualcomm and Broadcom as well as integrated DUT and remote automation control. With these features, customers are seeing considerable efficiency gains from their RF test equipment and further reducing their cost of test.

"We tested multiple wireless technologies ranging from Bluetooth to WiFi to GPS and cellular all with the same equipment using the NI Wireless Test System,” said Markus Krauss, HARMAN/Becker Automotive Systems GmbH. “The WTS and NOFFZ’s RF test engineering expertise helped us significantly reduce test time and the time it took to get our test systems up and running.”

The WTS is the latest system from NI built on PXI hardware and LabVIEW and TestStand software (see the Semiconductor Test System launched in 2014). With support for wireless standards from LTE Advanced to 802.11ac to Bluetooth Low Energy, the WTS is designed for manufacturing test of WLAN access points, cellular handsets, infotainment systems and other multi-standard devices that include cellular, wireless connectivity and navigation standards. Software-designed PXI vector signal transceiver technology inside the WTS delivers superior RF performance in the manufacturing test environment and a platform that can scale with the evolving requirements of RF test.

www.ni.com/



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