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News about Board and System Test
Test of DIMM Sockets with universal JTAG Hardware
12 July 2016 - JTAG Technologies announced a new family of hardware adapters specifically designed for testing of a variety of DIMM & SODIMM sockets (sizes and styles) using a JTAG/boundary-scan controller and supporting software. The problem of testing DIMM memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems.
Even when it is possible to create memory writes and reads from the boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving clients with little diagnostics information. What’s more clients will still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies clients get pin-point diagnostics from a known-good test interface so they can be certain if the socket is soldered correctly (or not).
The JT 2127-Flex system comprises two basic elements.
a) a high-speed multi-channel IO module – JT 2127/DMU, and b) a personality adapter for the chosen DIMM type – JT 2127-Flex xxx. The combination of the DMU and Flex adapter allows test signals to be sent to and from the boundary-scan source device on the UUT performing a thorough check for open pins and short circuits. In addition the voltages on the power pins of the DIMM socket are also measured. Currently supported DIMM types are xxx = 204-3, 244-mi3, 260-4 & 288-4. Due to the modularity of this test system other DIMM formats can be supported quickly upon request.
Software support is for test developments is provided through JTAG Technologies ProVision developer tool-suite which is shipped with a full set of support files for the new system. Completed DIMM socket test applications will also run on the full range of PIP runtime software modules and symphony systems where appropriate.
Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
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