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XJTAG supports Micron Phase Change Memory

23 July 2010 - XJTAG announced that it is the first to provide support for Micron Omneo™ Phase Change Memory (PCM). XJTAG provides test and development tools for high speed programming of Micron Phase Change Memory. Also XJTAG produces white paper on high speed programming of non-volatile Memories.

PCM enables enhanced system performance, and is programmed in situ after the board is assembled. XJTAG, working with Micron, has developed a solution to program PCM at close to its maximum programming speed using the XJTAG boundary scan system. It will allow customers to program PCM quickly on production lines or in development labs. This builds on XJTAG's successful XJFlash solution for high-speed programming of Flash memories.

“PCM is a compelling new memory technology that combines the best attributes found in NOR, NAND and DRAM,” said Jeff Bader, senior director of marketing for Micron's embedded group. “Because PCM is a new technology, it is imperative that we build a strong ecosystem of support to further customer adoption. We are pleased with the work XJTAG has done in building a programming solution, enabling PCM to be easily deployed in a production environment.”

The XJTAG boundary scan system is fast and easy to use for development or production, with features such as its high-level test-description language, graphical application helping engineers to visualise their circuits, and automated connectivity tests and DFT analysis. XJTAG's innovative software calculates how to utilise the boundary scan chain to maximise test coverage and accelerate programming of devices such as memories and PLDs.

Used in conjunction with the XJTAG boundary scan debug, test and programming system, XJFlash can be used to program and verify PCM devices provided there is an FPGA or CPU on the target board and this is connected up to the JTAG chain correctly.

A white paper explaining high speed programming of non-volatile memories is available from the XJTAG website

www.xjtag.com


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