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Free Web-Based Seminar examines Curve Tracer for Testing Power Semiconductors
15 July 2013 - Keithley Instruments is offering a free, web-based seminar titled “Testing Modern Power Semiconductor Devices Requires a Modern Curve Tracer.” This event, which is available for on-demand viewing, will discuss the curve tracing challenges posed by today’s power semiconductor devices and will teach viewers how to perform both I-V and high voltage C-V measurements with a modern parametric curve tracer.
“Testing Modern Power Semiconductor Devices Requires a Modern Curve Tracer” is recommended for engineers, physicists, and scientists involved in the designing, testing or manufacturing of power semiconductor devices and examines a variety of topics:
• The role of traditional curve tracers in testing power semiconductor devices
• The market drivers for modern power semiconductor devices
• How source measure unit (SMU) instruments can be configured to create a modern parametric curve tracer
• How to perform high voltage C-V measurements with a modern parametric curve tracer
About the Presenter
David Wyban is an applications engineer with Keithley Instruments, Inc. and has been with the company since 2006. David graduated cum laude from The Ohio State University and holds a Bachelor of Science degree in Electrical and Computer Engineering.
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