This website uses cookies to implement certain functions. If you use this website you agree to our Privacy Policy.
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  

Newsletter

Register to our newsletter
Every two weeks -
all news at a glance
captcha 

News - Component Test

Multitest launches HC Contactor for high parallel Test

09 September 2015 - Multitest announces that its new high power Kelvin contactor for strip test successfully passed a long term evaluation for a high volume automotive application at an Asian manufacturing site of a global IDM. The outstanding yield and contactor pin lifespan enable extraordinary OEE (overall equipment efficiency) and a lower overall cost of test.

The evaluation ran for over a year using a SO150 package for a high current automotive application requiring very high volumes. The results proved the outstanding performance of this contacting solution: >99% first pass yield and a contact pin life span of more than 1 million insertions.

The Multitest High Current Strip Contactor addresses two critical requirements: high power carrying capability and the limited space in a high parallel test set up. Usually, strip contactors are based on vertical probe designs, which cannot meet the electrical and thermal requirements of high current applications. The new contactor is based on the established Multitest ecoAmp Cantilever design and deliveries superior electrical performance and temperature accuracy.

www.multitest.com/



Related Articles:

No related articles found


Upcoming Events

productronica 2017
Munich (Germany)
14 to 17 November 2017
Semicon Europa 2017
Munich (Germany)
14 to 17 November 2017
SPS/IPC/DRIVES 2017
Nuremberg (Germany)
28 to 30 November 2017

Social Media

twitter_follow_420x50px