News - Component Test

Agilent enhances Parameter Analyzer with more Capabilities

05 June 2013 – Agilent Technologies announced source/monitor unit (SMU) and software enhancements to its B1500A semiconductor parameter analyzer. The new B1514A 50-µs pulse medium-current SMU gives a faster pulse at 30V/1A range plus oscilloscope-like viewing. The new B1511B medium-power SMU delivers 0.1 fA low-current measurement capability at a lower price with an optional atto-sense switch unit.

The latest EasyEXPERT 5.5 software enables remote test without complex programming, using more than 300 ready-to-use application tests in addition to manual operation.

Agilent has consistently delivered parametric test performance and value since early1980, when the company introduced the world’s first digital parametric analyzer. In keeping with this tradition, the new B1500A supports all aspects of characterization for IV (0.1 fA – 1 A/0.5 µV – 200 V), capacitance (1 kHz – 5 MHz) and ultra-fast pulsed/transient IV measurement down to ns order.

The enhancements for the B1500A semiconductor device analyzer include:

• Faster pulsed measurements using the B1514A, a 50 µs pulse medium-current SMU. The enhanced analyzer enables a pulsed measurement down to 50 µs pulse width, a 10X or more narrow pulsed measurement than provided by a comparable conventional SMU. In addition, the instrument offers wider range and versatility, up to 30 V / 1A, with voltage/current programmability. Pulsed IV measurements are typically required to characterize today’s advanced materials and devices. The EasyEXPERT oscilloscope view is supported for the B1514A to monitor the actual voltage and current waveform. With this feature, users can confidently verify the pulsed measurement setup and optimize its parameters quickly and easily.
• Very low current measurement down to 0.1 fA at lower cost, using the new B1511B medium-power SMU with an atto-sense and switch unit. This meets the requirements for accurate low-current characterization, such as leakage current, in order to accelerate research and development for next-generation devices.
• Easy device characterization with EasyEXPERT 5.5. The updated software features remote control to execute the built-in application test, GUI to control switching matrix, and extension of the application library. In addition, it supports the oscilloscope view for the B1514A 50 µs pulse medium-current SMU. EasyEXPERT is GUI-based software operating on Windows 7; it offers efficient and repeatable device characterization ranging from interactive manual measurements to semi-automated wafer test.

The Agilent B1500A semiconductor parametric analyzer, with the new B1514A and B1511B SMU modules and EasyEXPERT software enhancements, offers a complete device characterization solution with versatility, uncompromised measurement reliability, and efficient, repeatable measurements. It supports all state-of-the-art measurements for parametric test, enabling electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device.

www.agilent.com/find/b1500a/