InPhone system for high parallel MEMS Microphone Test

19 September 2011 - Multitest, a designer and manufacturer of final test handlers, contactors and load boards, has shipped the first InPhone system to a European site of a major IDM. Combined with the Multitest InStrip handler, the InPhone system is dedicated to high parallel MEMS test and the calibration of MEMS microphones. The InStrip has been configured for InCarrier test. Thus, singulated MEMS packages can be tested with the high parallelism of the InStrip handler.

Microphone MEMS devices are becoming more and more important for state-of-the-art mobile communication applications. These applications require an expanded linear frequency range and usually need small packages, but at the same time they are very cost sensitive.

Mulltitest’s InPhone solution is based on an excitement in a pressure chamber that ensures homogenous acoustic stimuli across all parallel tested packages. The InCarrier concept supports stable high-parallel test even for small packages. Therefore, this setup provides unique performance and cost-of-test advantages.