|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - General T&MCompact Boundary Scan Production Tester30 June 2015 - GOEPEL electronics presenteds the JULIET Series2, the latest generation Boundary Scan production test platform. The compact desktop system includes fully integrated Boundary Scan test hardware, power supply and an interchangeable adapter system for flexible UUT (Unit Under Test) contact. The new JULIET (JTAG UnLimIted Tester) is particularly suitable for production testing in the low and mid volume range as well as for repair. In addition, the JULIET system supports all Embedded System Access (ESA) technologies and is ideal for complex assemblies. JULIET also can be used for programming of non-volatile memories such as Flash or MCU. The functionality, in terms of dynamic structure and cluster testing, is significantly expanded due to the new mixed-signal architecture of the tester channels. In conjunction with the new Boundary Scan features, JULIET Series2 offers a significant improvement in test coverage. Thanks to the compatibility between hardware and software, programming and testing procedures can be transferred from the prototype phase directly into production. The JULIET Series2 is backward compatible with the existing family of products. All JULIET systems offer flexible programmable power supplies including current measurement for connecting up to four parallel target applications. An integrated interchangeable adaptor appliance with type recognition allows standard UUT adaptations through needle contacts or real connectors with simultaneous access to all interface signals, even in the active state. Due to this, the selective monitoring of critical signals is tremendously facilitated and debugging becomes more effective. Based on this, a broad use of the systems in various markets and applications is possible. Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |