|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - General T&MMulti-lead Probe for PCI Express 3.013 February 2012 - LeCroy announced a new multi-lead probe for the Summit T3-16 and Summit T3-8 Protocol Analyzers, supporting the PCI Express 3.0 specification (which includes data rates up to 8 GT/s). The LeCroy PCI Express protocol analyzer product line has the largest selection of PCI Express backplane and connector probing technologies in the industry. Adding the multi-lead probes to this extensive collection provides an essential accessory for debugging hard-to-accessPCI Express systems and buses. Multi-lead probes are used by system developers to probe point-to-point bus signals (e.g. for serial data buses that run between chips on a single circuit board), or for probing serial buses when there is no supported interposer card. The probe is expandable to support from x1 to x16 PCI Express lanes when using a Summit protocol analyzer. Probe tips are flexible for tapping signals in narrow areas on circuit boards. The probe head uses LeCroy's new Gen3 tapping technology which increases signal integrity and offers precision signal tapping for 8GT/s. "LeCroy is now in its third generation of multi-lead probe solutions for PCI Express," said John Wiedemeier, Product Marketing Manager, Interconnect Communications Group, LeCroy. "Many exciting high speed I/O embedded applications will be utilizing PCI Express 3.0 technology. Developers have learned to rely on LeCroy's robust probing design and high signal integrity for data analysis and measurement. The multi-lead probe for PCI Express 3.0 will extend the probing reach of developers, bringing powerful analysis tools to solve their system issues and keep them on track with their project schedules." All LeCroy protocol analyzers feature a hierarchical display, real-time statistics, protocol traffic summaries, detailed error reports, powerful scripting, and the ability to create user-defined test reports, which in combination provide a powerful analysis system to allow developers to troubleshoot intricate problems and to finish their projects on time. The PCI Express 3.0 multi-lead probe is now available to order. www.lecroy.comRelated Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |