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Latest Test and Measurement NewsSource/Measure Units offer Output up to 80W and 8A24 February 2015 – Keysight Technologies announced the addition of two source/measure units (SMUs) to its N6700 Series modular power systems – the N6785A two-quadrant SMU for battery drain analysis and the N6786A two-quadrant SMU for functional test. Both SMUs provide power output up to 80 W. The two new SMUs expand the popular N6780A Series SMU family by offering up to four times more power than the previous models. High Volume Test and Calibration of Barometric Sensors24 February 2015 - Multitest introduced a new MEMS test and calibration solution for barometric sensors. InBaro provides a reliable multisite test and calibration for barometric pressure sensors and gas detection sensors for e.g. 144 and more devices in parallel with a maximum signal count of 2400 pins per insertion. It enables temperature test at a range form – 40°C up to +125°C with high temperature accuracy and stability. RoodMicrotec appointed Martin Sallenhag as CTO23 February 2015 - RoodMicrotec N.V. announced the appointment of Mr Martin Sallenhag MSc as Chief Technical Officer (CTO) as of 1 March 2015, succeeding Mr Norbert Wirth. Mr Wirth was CTO with RoodMicrotec since 2011; he sadly died at the end of 2014 after a long illness. Both the supervisory board, the management board and the employees are deeply saddened by Mr Wirth's death, and will miss his experience and knowledge. Verification of TDD/FDD LTE Bands for mixed Carrier Aggregation20 February 2015 - Rohde & Schwarz has successfully verified combining various frequency bands in mixed-mode TDD and FDD mixed carrier aggregation. During the test, the R&S CMW500 wideband radio communication tester from Rohde & Schwarz simulated an LTE network with simultaneous time division duplex (TDD) and frequency division duplex (FDD). The data was successfully transferred to the DUT on multiple aggregated carriers in different duplex modes. Automated Final Testing of Mobile Devices19 February 2015 - JOT Automation introduced the JOT G3 an all-in-one final tester for smartphones. It also enables fully automatic tests on wearables like smartwatches in a repeatable and reliable environment. JOT G3 executes multiple tests in a single platform. The solution with a compact footprint is capable of running all the required DUT interface tests on, for example, RF, electrics, mechanics, touch screen, buttons, audio, and plug-in connections. PCI and PXI Resistor Modules19 February 2015 - Pickering Interfaces expands its range of PCI and PXI Programmable Resistors with the introduction of two new modules. These new solutions include the PCI Programmable Resistor & Relay Card (model 50-294) and the PXI Programmable Resistor & Relay Module (model 40-294). Wireless Test Set supports LTE-A Carrier Aggregation with 3CC, TDD, Uplink Measurements18 February 2015 – Keysight Technologies expanded the capabilities of the E7515A UXM wireless test set. The new features address the rapidly evolving 3GPP LTE-Advanced carrier aggregation advancements. The UXM wireless test set is a highly integrated signaling test set created for functional and RF design validation in the 4G era and beyond. The UXM supports multiple cells, downlink and uplink carrier aggregation, MIMO up to 4x2 and integrated fading – allowing users to assess design readiness with greater confidence. More Articles ...
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