|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement News
Inspection and Review Solutions for 16nm Node30 July 2014 - KLA-Tencor announced four new systems — the 2920 Series, Puma 9850, Surfscan SP5 and eDR 7110 — that provide advanced defect inspection and review capability for the development and production of 16nm and below IC devices. The 2920 Series broadband plasma patterned wafer, Puma 9850 laser scanning patterned wafer, and Surfscan SP5 unpatterned wafer defect inspection systems deliver enhanced sensitivity and significant throughput gains.
BroadR-Reach Interface Verification with Oscilloscopes29 July 2014 — Rohde & Schwarz has expanded the application field of the R&S RTO oscilloscopes to include the testing of automotive Ethernet interfaces. In line with the OPEN Alliance test specification, the new R&S RTO-K24 compliance test software enables users to perform automated tests on BroadR Reach Ethernet interfaces. BroadR Reach technology makes it possible to combine multiple applications such as video streaming from rear view cameras and signal transmission from automotive radar systems to create a single, open and scalable Ethernet network inside the vehicle.
MIPI M-PHY v3.0 Interface S-Parameter and Impedance Testing29 July 2014 – Agilent announced the availability of its Method of Implementation (MOI) document for the transmitter/receiver (Tx/Rx) interface S-parameter and impedance tests defined in version 3.0 of the MIPI Alliance Specification for M-PHY. The MOI, and a test package such as a state file, which makes setup and measurement easy, works with the ENA Series network analyzer’s enhanced time domain analysis option (E5071C-TDR).
Simple Import of AOI Test Programs28 July 2014 - The AOI systems of GOEPEL electronics now offer an import option for test programs of other system providers. The conversion shortens time for generation of test programs significantly compared to the use of CAD and pick & place data. PCI Precision Programmable Resistor Solutions28 July 2014 – Pickering Interfaces expanded its range of PCI precision programmable resistor solutions with two new PCI cards. The new PCI RTD Simulator Cards support the emulation of resistive temperature sensors and the PCI Strain Gauge Simulator Cards offer six bridge channels to simulate strain gauges. All cards are available in different configurations.
New 7.5 GHz Spectrum Analyzers from Rigol25 July 2014 - Rigol Technologies announced two new high-performance, high frequency spectrum analyzers built on the popular DSA800 series platform. The DSA832 and DSA875 expand the DSA800 series spectrum analyzer family to 3.2 and 7.5 GHz respectively. The new instruments are intended for design and development implementing Wi-Fi, Bluetooth, and other RF standards.
High Frequency Signal Amplifier with 34Vp-p Output25 July 2014 -Tabor Electronics announced the new A10160, an ultra-small footprint, wideband, DC coupled amplifier designed for high frequency, high current, signal amplification. Offering 45MHz bandwidth at up to 34Vp-p into 50 Ohm with transition times of less than 10ns, the A10160 is an ideal accessory for the Tabor line of signal sources, extending the signal generation capabilities to higher amplitudes and current, while maintaining fast transition times and low distortion. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |