|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - Board and System Test
Analysis of long Signal Sequences on Rohde & Schwarz Oscilloscopes18 November 2014 - Equipped with the R&S RTM-K15 history and segmented memory option, the R&S RTM bench oscilloscope enables users to analyze longer signal sequences than is possible with any other instrument in this class. The R&S RTM automatically acquires only the relevant signal sequences, such as bursts or pulses, and stores them in segmented memory. The oscilloscope's full functionality can then be used to analyze the acquired signals in detail. AR and MVG cooperate to provide Turnkey Solutions18 November 2014 - AR and MVG (Microwave Vision Group) signed a memorandum of agreement to offer a greater choice of quality EMC and Antenna Measurement turnkey solutions based on their combined expertise and product portfolio. AR brings its brand name, experience, and extensive line of EMC and RF/Microwave products to marry with MVG installation expertise and diverse product range, starting with MVG-EMC shielded rooms and absorbers, to deliver quality, high performance turnkey products for EMC and other markets.
Agile Signal Generator provides fast switching in complex Multi-Emitter Simulations17 November 2014 – Keysight Technologies announced the N5193A UXG agile signal generator, an off-the-shelf instrument that enables highly realistic and scalable threat simulations for aerospace/defense applications. The UXG is also a dependable slide-in replacement for the legacy fast-switching local oscillators (LOs) often used in large, dedicated simulation systems. Wideband Digital Channel Simulator for Satellite Link Emulation13 November 2014 – IZT has added an Arbitrary Waveform Generator (ARB) to its IZT C3040 wideband digital channel simulator. The ARB enables the IZT C3040 to emulate other traffic on the satellite transponder, signals in adjacent bands or interference scenarios. With the internal ARB memory, the IZT C3040 now supports the generation of user-defined signals, for example using MATLAB, which increases its flexibility.
Multi-functional Boundary Scan I/O Modules oimproves Test Coverage11 November 2014 - GOEPEL electronics presents the CION-LX Module/FXT96, a new boundary scan module with high functionality and dynamics for test of analog, digital and mixed signals. The module allows the extension of boundary scan test to non scannable circuit components such as connectors, clusters or analog interfaces. The standards IEEE1149.1, IEEE1149.6 and IEEE1149.8.1 are supported. There are 96 single-ended, 12 High Current and 24 differential channels available.
X-ray Inspection System for larger electronic Assemblies10 November 2014 – Viscom has extended its portfolio in the X-ray inspection range with a new, flexible inspection system. The X8068 universal X-ray inspection system unites the high inspection quality and technology of the proven Viscom X-ray systems with an extended inspection scope for larger electronic assemblies. With this solution, electronics manufacturers could not be better equipped as far as both test piece size and application are concerned.
Corelis releases new Version of Boundary-Scan Tool Suite07 November 2014 - Corelis announced the availability of version 8.1 of its ScanExpress Boundary-Scan Tool Suite. This new version adds powerful visualization features to the ScanExpress Debugger JTAG analyzer and toolkit making it easier than ever to control and manage debug sessions. Also included are interface improvements for ScanExpress TPG, plus numerous new features spanning all ScanExpress software applications. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |