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Readers Top 5 News of last 30 days
News - Board and System TestJDSU enhances Base Station Analyzer27 January 2013 - The CellAdvisor JD780A Base Station Analyzer Series of JDSU now supports LTE-Advanced, analyzing up to five component carriers and MIMO with two or four transmitting branches. Also new is PIM detection, and users can now control the instrument wirelessly up to 328 ft (100 m) via Bluetooth. These advanced capabilities let users keep pace as LTE evolves, and allow the safe testing of high-mounted remote radio units from the ground. Tektronix delivers expanded MIPI M-PHY Receiver Test Solution24 January 2014 – Tektronix announced expanded capabilities for its M-PHY Receiver test solution. The additional capabilities include physical layer receiver testing for High Speed Gear2 and Gear3, support for PWM Mode (G0-G7), auto-calibration and margin testing. Support for HS Gear2 and Gear3 and PWM Mode (G0-G7) gives designers the flexibility to perform tests at the full range of data rates for comprehensive insights into their designs. GNSS Simulator supports also Chinese BeiDou Standard24 January 2013 — Rohde & Schwarz extends the functionality of the R&S SMBV100A vector signal generator by adding BeiDou/Compass capability to its integrated GNSS (Global Navigation Satellite System) simulator. With the R&S SMBV-K107 option the GNSS simulator now covers the BeiDou standard as well as the GPS, Galileo and Glonass satellite navigation systems. Fast Design-to-Automated Inspection Data Flow23 January 2013 - CyberOptics announces the close-to-immediate setup of PCBA inspection using Automated Optical Inspection (AOI) and Solder Paste Inspection (SPI) systems for new products in just one simple step. Programming automated inspection systems has been a long-standing bottleneck for the acceleration of the new product introduction (NPI) process; a barrier now removed using the Mentor Valor Process Preparation programing tool in conjunction with CyberOptics inspection systems. Development, Test and Debug Environment for Freescale and STMicroelectronics Microcontrollers22 January 2014 – The Universal Emulation Configurator (UEC) from PLS Programmierbare Logik & Systeme is now also available for the emulation devices MPC57xx from Freescale and SPC57x from STMicroelectronics. With the help of this special tool for definition of trace and measurement tasks for on-chip emulation logic, the full potential of the emulation devices can be used for the first time without any limitations for troubleshooting and software quality assurance. 3D X-Ray Inspection System with additional optical Inspection20 January 2014 - GOEPEL electronic enhanced its 3D X-ray inspection system OptiCon X-Line 3D with numerous new functionalities. By integration of a module for Automated Optical Inspection (AOI), the system represents the world’s first so called “AXOI combinational system”. The term means that the OptiCon X-Line 3D system primarily inspects assemblies with x-ray, and only the inspection tasks impossible to execute with AXI are taken over by the integrated AOI module. HDMI 2.0 Compliance Test Software for Transmitters and Receivers16 January 2014 – Agilent Technologies introduced two compliance test software packages for physical-layer testing of devices that use the new High-Definition Multimedia Interface (HDMI) 2.0 specification. The transmitter compliance test software allows engineers to use Agilent Infiniium oscilloscopes to test their HDMI 2.0 transmitters. Agilent’s receiver compliance software can be used with the company’s transition-minimized differential-signaling signal generator platform and the Agilent M8190A arbitrary waveform generator to test HDMI 2.0 receivers. More Articles ...
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