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Readers Top 5 News of last 30 days
News - Board and System TestAeroflex supports 3GPP WCDMA Release 912 August 2010 — Aeroflex announced that its Infrastructure test system TM500 Test Mobile has added support for the 3GPP WCDMA Release 9 standard, the latest evolution of the HSPA+ standards, which permits concurrent operation of MIMO (Multiple-Input, Multiple-Output) and DC-HSDPA (Dual Cell High-Speed Download Packet Access). This doubles the maximum data rate to 84 Mbps. First Jitter Measurement Solution for Synchronous Ethernet11 August 2010 – JDSU introduced a new jitter feature for the JDSU Optical Network Tester series (ONT-503, 506 and 512) that establishes the ONT as the first and only jitter analysis solution able to conduct both jitter and wander measurements on 10GE Synchronous Ethernet (SyncE) devices and systems. These capabilities help to ensure reliable signal and network performance of mobile backhaul networks for the delivery of high-quality bandwidth-intensive services such as video. Low Voltage JTAG Adapter for Intel Processors10 August 2010 – Corelis, Inc has announced the availability of a new active Low Voltage Adapter for compatibility between Corelis’ boundary-scan controllers and low voltage JTAG designs operating below 2.5V. The Low Voltage Adapter is rated to support up to 100 MHz TCK speeds, employs ESD protection, and is capable of driving up to 90mA on its outputs. LTE Conformance Test System with GCF and PTCRB approval04 August 2010 - Anritsu’s ME7873L RF Conformance Test System and ME7832L Protocol Conformance Test System for testing LTE mobile terminals have already received GCF approval and now have received PTCRB approval for 30 (ME7873L) and 20 (ME7832L) test cases supporting the wireless bands used in North America (Band 4, 13, 17, etc.). XJTAG supports Micron Phase Change Memory23 July 2010 - XJTAG announced that it is the first to provide support for Micron Omneo™ Phase Change Memory (PCM). XJTAG provides test and development tools for high speed programming of Micron Phase Change Memory. Also XJTAG produces white paper on high speed programming of non-volatile Memories. Test Vector Interface for IEEE1450 (STIL)09 July 2010 - GOEPEL electronic introduces a new test vector interface as a new extension of its software platform SYSTEM CASCON. The newly developed vector link is based on IEEE1450 – Standard Test Interface Language (STIL) – and enables the seamless coupling during test pattern export, in particular to chip testers. Desktop RF diagnostic chamber21 July 2010 - The compact R&S DST200 RF diagnostic chamber of Rohde & Schwarz makes it easy for developers of wireless devices such as mobile phones to perform reproducible radiated RF measurements on the workbench. The benchtop chamber simulates conditions that approximate free space and features a 700 MHz to 6 GHz broadband test antenna especially designed for the chamber. More Articles ...Related Articles: |
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