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News - Board and System TestNational Instruments to Add LTE Automated Test Capabilities18 October 2010 – National Instruments will be adding Long Term Evolution (LTE) test capabilities to its RF test product portfolio with the forthcoming NI LTE Measurement Suite, which operates with PXI RF signal generators and analyzers. NI engineers will demonstrate the new LTE Measurement Suite at the 2010 4G World conference in Chicago on October 20–21. TraceSpan and QualiSystems Partner to Provide Test Automation Solutions12 October 2010 - TraceSpan Communications, a supplier of broadband analysis and monitoring solutions, and QualiSystems, a provider of Test Automation solutions for systems, network equipment and electronic devices announce today their joint solution for test automation of broadband access networks and equipment. The successful integration of QualiSystems TestShell framework and TraceSpan's Xpert analyzers enables end-to-end automation of broadband access networks and products testing. New Signal Injectors for Regulator and Power Supply Test11 October 2010 - Picotest.com has released a new family of Signal Injectors which greatly improve voltage regulator, LDO, and power supply testing accuracy. Increased bandwidth and higher resolution measurements are enabled for PSRR, stability, crosstalk, reverse transfer, input impedance, Bode plots, and crosstalk tests along with non-invasive in-circuit testing for load transients, stability and output impedance. The Signal Injectors work with network analyzers, oscilloscopes, and arbitrary waveform generators from all manufacturers. Complete JTAG Development Package07 October 2010 - JTAG Technologies announced a new economically-priced software and hardware system for board-level and system designers looking to benefit from a boundary-scan test and programming strategy. Emulation Technology to support ARM’s Serial Wire Debug (SWD) Interfaces06 October 2010 - GÖPEL electronic announces the extension of the innovative emulation technology VarioTAP to support ARM’s Serial Wire Debug (SWD) interfaces. VarioTAP’s functional range includes on-chip programming up to emulation tests at system level, and is based on processor specific library models in the form of software IP. The new VarioTAP models’ first implementation covers the ultra low energy MCU of Energy Micro’s EFM32 Gecko series with Cortex-M3 core. Corelis Launches Free JTAG Test Executive27 September 2010 – Corelis, Inc., a supplier of high-performance boundary-scan test and measurement tools, announced the availability of Runner-Lite, a free software test executive for performing boundary-scan testing, JTAG Embedded Testing (JET), and in-system device programming using pre-generated test plan files built for specific reference boards. Aeroflex Announces the New CS9000 Broadband Signal System23 September 2010 — Aeroflex presented at AUTOTESTCON in Orland/Florida its new CS9000 Broadband Signal System (BSS). The CS9000 BSS is the premier test system for signal generation and recording for simulation and analysis of advanced communications signals in extreme environments. An integrated, modular system comprised of the operational elements of Aeroflex’s Broadband Signal Analyzer and Generator (BSAG), the CS9000 BSS provides the widest bandwidth and deepest memory modular RF/baseband test system on the market today. More Articles ...
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