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Readers Top 5 News of last 30 days
News - Board and System TestAnritsu and Keycom sign Automotive Radar Test Collaboration11 July 2016 - Anritsu and Keycom have signed a collaboration agreement based on which Anritsu becomes the exclusive distributor in EMEA of the Keycom Radar Test System developed for verification of automotive radars. PCI Express 4.0 Test Solution supports Data Rates up to 16 GT/s06 July 2016 - Tektronix announced a series of enhancements to its suite of PCI Express (PCIe) test solutions including support for the 16 GT/s data rate and the industry’s first automated transmitter and receiver test solutions supporting the PCIe 4.0 architecture. With the faster data rates for PCIe 4.0 technology come new test challenges such as major increases in channel loss, tightening of the total jitter budget and more complex link training and timing requirements. Test Probe for Lead-Free Fine Pitch PCBA Test Applications05 July 2016 - Everett Charles Technologies (ECT) introduces the LFRE-39 spring probe to complete its comprehensive portfolio of products for lead-free test applications. LFRE-39 features ECT’s LFRE plating and is designed to meet fine pitch requirements down to 39 mil (1.0 mm). The LFRE-39 fully meets the demanding requirements of high volume production in-circuit and functional test. BERT Solution for Characterization of PAM-4 and NRZ Devices04 July 2016 – Keysight Technologies introduced a M8040A high-performance BERT for testing PAM-4 and NRZ devices that operate up to 64 GBaud. Engineers in validation labs and R&D who characterize receivers on the physical layer for the next generation of data center interconnects will benefit from simplified test setups and repeatable and accurate results. Simplified Troubleshooting on highly complex SoCs28 June 2016 – With highly complex automotive microcontrollers ‒ such as Infineon’s AURIX family or the PowerArchitecture-based SPC58E series from STMicroelectronics ‒ very large amounts of trace data accrue in a very short period of time, especially when the data are recorded through a high bandwidth trace interface like Aurora. PLS’ UDE 4.6.2 with unique search function supports the rapid analysis of very large amounts of trace data. LTE-Advanced RF Conformance Test System23 June 2016 – Anritsu Corporation announced that the ME7873LA LTE-Advanced RF Conformance Test System has achieved world-first Global Certification Forum (GCF) approval for more than 80% test cases supporting the 3 Downlink Carrier Aggregation (3DL CA) RF Conformance Test. Cost-effective Automotive Test Environment22 June 2016 - The magicCAR TC is a modular and scalable test system for a wide range of applications. The miniaturized tester is a cost-effective test environment for development and quality assurance. The combination of simulation and validation components allows flexible use in customer-specific applications. Thanks to the replaceable hardware modules further test resources can be integrated and parallelized easily. This enables a variety of additional applications such as endurance tests, screening tests or parallel tests. More Articles ...
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