AI-Powered Requirements-Based Test Creator
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- Board-/System-Test
- 27-03-2026
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05 December 2025 - GÖPEL electronic offers integration packages for Takaya's APT-2600FD flying probe testers to seamlessly incorporate boundary scan into the test routines. This eliminates the need for manual contacting of the PCBA, saving time-consuming handling steps. Component testing, boundary scan, programming, and functional testing are thus performed on one and the same system. The Takaya APT-2600FD system with the multiprobe option allows users to flexibly contact their own pad geometries with a mini adapter.
04 December 2025 — Rohde & Schwarz launched the R&S NGT3600 series, a new line of DC power supplies offering up to 1800 W per channel. These power supplies are highly versatile, providing adjustable output voltages of up to 80 V. The two channels of the R&S NGT3622 model can be combined in series or parallel, allowing users to double either the voltage or the current. For applications requiring even more power, up to three units can be connected, delivering up to 480 V or 300 A across six channels.
03 December 2025 – Pickering Interfaces announced a new compact 12-slot LXI/USB modular chassis: the 60-107-001. The highest PXI slot density chassis for PXI and PXIe modules, it provides 12 hybrid-compatible slots in a 2U form factor, and can be controlled via either USB or LXI (Ethernet)—eliminating the need for a dedicated PXI controller or embedded PC. The USB-compatible and LXI-compliant interfaces enable the chassis to be controlled directly through standard interfaces commonly found on most PCs, providing a very cost-effective route into modular test and measurement applications.
02 December 2025 - Instrument Systems introduces the STA Stand‑Alone Screen Photometer — a modular, vehicle‑based measurement solution that combines the LumiCam 4000B imaging luminance camera with the new ACS 635 calibration source to deliver fast, high‑resolution photometric and geometrically corrected testing of automotive headlamps, including adaptive lighting functions.
Read more: Stand‑Alone Photometer for vehicle‑based Headlamp Test
01 December 2025 - Keysight Technologies introduces the next generation of Keysight i7090 Massively Parallel and Scalable Board Test System, redefining high-volume PCBA manufacturing by delivering fast, low-cost testing in a modular and scalable unified platform. Electronics manufacturers are under pressure to test increasingly complex PCBAs at higher volumes while keeping costs and factory footprints under control. The Keysight i7090 overcomes these challenges by unifying multiple test methodologies into a single compact platform and scaling throughput with parallel test capability. Unlike conventional solutions that require multiple test systems and setups, the i7090’s parallel architecture supports up to 20 simultaneous test cores, enabling manufacturers to dramatically increase throughput and efficiency.
28 November 2025 – Vector has introduced the new hardware-in-the-loop (HIL) test system vCTS.performance. This powerful, scalable test system was developed in collaboration with EA Elektro-Automatik for testing the charging communication between electric vehicles (EV) and supply equipment (EVSE). It meets the demanding power requirements of the Megawatt Charging System (MCS), while also supporting all major charging standards. The system is now available.
27 November 2025 — Rohde & Schwarz and Samsung are collaborating to bring 5G NR-NTN to market. Both companies have worked together to enable the validation of the first 5G-based New Radio non-terrestrial networks (NR-NTN) test cases in accordance with the 3GPP test specifications for RF (Radio Frequency), RRM (Radio Resource Management) and PCT (Protocol Conformance Testing) using conformance test solutions from Rohde & Schwarz. The validated test cases, as defined by PTCRB (PCS Type Certification Review Board) RFT 555 (Request for Testing), were conducted on the R&S TS8980 Conformance Test Platform, the R&S TS-RRM and the CMX500 in frequency range 1 (FR1) verifying Samsung’s latest NR-NTN chipset as device under test (DUT).
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