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Latest Test and Measurement NewsNI launched new NI VeriStand Software08 July 2016 – National Instruments (NI) released the latest version of its VeriStand software, which embedded software design and test engineers use to develop hardware-in-the-loop (HIL) test systems. Today’s engineers face increasingly compressed, shifting schedules and constantly changing requirements driven by the integration of new technologies. VeriStand and NI’s HIL systems are the most open and customizable platforms available on the market to help companies meet these changing demands and future proof their test systems. Rohde & Schwarz appointed new President and CEO07 July 2016 - As of July 1, 2016, Christian Leicher and Peter Riedel lead Rohde & Schwarz. Leicher, the new President and CEO, has been a member of the Executive Board since 2005. With his appointment as President and CEO, a managing partner is now taking the helm at Rohde & Schwarz. Riedel remains President and COO. He has worked successfully for Rohde & Schwarz for 25 years and joined the Executive Board two years ago. Cost-Effective Testing of RF Semiconductors07 July 2016 - Advantest introduced its Wave Scale generation of channel cards for the V93000 platform, which delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal ICs for wireless communications. Designed for highly parallel multi-site and in-site parallel testing, the new V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF semiconductors while creating a path for testing future 5G devices. PCI Express 4.0 Test Solution supports Data Rates up to 16 GT/s06 July 2016 - Tektronix announced a series of enhancements to its suite of PCI Express (PCIe) test solutions including support for the 16 GT/s data rate and the industry’s first automated transmitter and receiver test solutions supporting the PCIe 4.0 architecture. With the faster data rates for PCIe 4.0 technology come new test challenges such as major increases in channel loss, tightening of the total jitter budget and more complex link training and timing requirements. Test Probe for Lead-Free Fine Pitch PCBA Test Applications05 July 2016 - Everett Charles Technologies (ECT) introduces the LFRE-39 spring probe to complete its comprehensive portfolio of products for lead-free test applications. LFRE-39 features ECT’s LFRE plating and is designed to meet fine pitch requirements down to 39 mil (1.0 mm). The LFRE-39 fully meets the demanding requirements of high volume production in-circuit and functional test. BERT Solution for Characterization of PAM-4 and NRZ Devices04 July 2016 – Keysight Technologies introduced a M8040A high-performance BERT for testing PAM-4 and NRZ devices that operate up to 64 GBaud. Engineers in validation labs and R&D who characterize receivers on the physical layer for the next generation of data center interconnects will benefit from simplified test setups and repeatable and accurate results. Eye Diagrams Capabilities for Serial Trigger and Decode Solutions01 July 2016 - Teledyne LeCroy expanded the Serial Data Analysis capabilities for its oscilloscope solutions by introducing as first oscilloscope manufacturer Eye Diagram capabilities in the new TDME Serial Bus options. Eye diagram mask testing and mask failure locator can be used to identify physical layer anomalies. More Articles ...
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