|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement NewsRF Conformance Tests for LTE band 14 public Safety Networks16 June 2016 - Rohde & Schwarz has validated six RF conformance test cases for LTE-capable high-power user equipment (HPUE), allowing the certification of such devices to start. The R&S TS8980 test system is the first and so far only test system that covers these tests for LTE band 14 public safety networks. With this accomplishment, Rohde & Schwarz is paving the way for LTE's expansion into critical communication applications. Faster 3D X-Ray Inspection15 June 2016 - GOEPEL electronic announced the newest version of the industry proven X-ray inspection system X Line·3D. The new Series 300 is a pioneering solution for automatic inspection of double-sided PCBs combining 3D AXI and AOI into one system. Mechanical changes and a revision of the system software enhance test speed for even higher cycle times with lower maintenance requirements. Comprehensive 100G Ethernet Compliance Test Software15 June 2016 – Keysight Technologies introduced the industry’s most comprehensive compliance application software for testing electrical characteristics of 100G four-lane attachment unit interface (CAUI-4) networking applications. The software supports the IEEE 802.3bm standard, which accommodates optical networking advances and enables higher density applications. Die-Level Handling System for KGD Test Strategy14 June 2016 – Advantest Corporation introduced its HA1000 die-level handler, a cost-efficient test solution for determining known good dies (KGD) prior to IC packaging. The HA1000 is designed to handle a wide variety of devices from large high-power server/GPU type devices to small system-on-chips (SoCs) and memory devices/stacks, such as HBM2. Tektronix expands Serial Standards Testing on DPO70000SX Oscilloscopes13 June 2016 - Tektronix is enabling serial bus test support for 4th generation standards including USB3.1, Thunderbolt over USB Type-C, PCIe Gen4 and DDR4 on the DPO70000SX Series. This new oscilloscope family offers incredible signal fidelity enabling precise margin analysis on 4th generation serial data rates beyond 10Gb/sec. Featuring patented Asynchronous Time Interleaving (ATI) signal acquisition technology, the DPO70000SX platform offers industry-best signal fidelity and performance coupled with a scalable architecture. 18-Slot PXIe Chassis with 24 GB/s System Bandwidth10 June 2016 – Keysight Technologies announced a Gen 3 PXIe chassis and set of Gen 3 system components designed for complex, high-performance applications. Doubling the system bandwidth, the new products improve data streaming for capture/playback applications, such as 5G and electronic warfare. The Gen 3 products also provide a superior platform for large multi-channel and multi-chassis PXIe test systems for applications, such as MIMO and PA/FEM. Contactor for Large I/O Count BGA Devices09 June 2016 - Multitest launched the Atlas contactor, which has been optimized for cost-efficient and reliable testing of high end digital high ball count BGAs. Based on the well-established Multitest QuadTech flat probe technology, the Atlas contactor combines advanced mechanical and electrical probe technology for improved functionality and performance in manual test and automated test. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |