|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement NewsCost-efficient RF Contactor Solution for FBGA, QFN and Wafer-Level Packages30 June 2016 - Multitest introduced the ACE Contactor, which offers optimal RF performance for fine pitch FBGA, QFN and wafer-level packages. Typical applications for this new contactor are Power Amplifiers, RF switches and mobile communications. The ACE probe has a revolutionary new architecture, which provides exceptional electrical performance, both DC and RF. Impedance Analyzer and LCR Meter measures from DC to 5 MHz29. June 2016 - Zurich Instruments launched a new Mid-Frequency Impedance Analyzer and Precision LCR (MFIA) Meter. The MFIA measures in the frequency range from DC to 5 MHz. Based on the Zurich Instruments' Mid-Frequency (MF) platform, which was successfully introduced in 2015, the MFIA offers 0.05% basic accuracy and a measurement range spanning 1 mΩ to 10 GΩ. It is optimized for testing discrete components, dielectrics, solar cell and semiconductors, as well as bio-impedance monitoring and microfluidic applications. Simplified Troubleshooting on highly complex SoCs28 June 2016 – With highly complex automotive microcontrollers ‒ such as Infineon’s AURIX family or the PowerArchitecture-based SPC58E series from STMicroelectronics ‒ very large amounts of trace data accrue in a very short period of time, especially when the data are recorded through a high bandwidth trace interface like Aurora. PLS’ UDE 4.6.2 with unique search function supports the rapid analysis of very large amounts of trace data. Advantest ships 800th V93000 Port Scale RF Tester27 June 2016 – Advantest has installed its 800th V93000 Port Scale RF test system, with the landmark unit going into the production facility of Jiangsu Changjiang Electronics Technology Co. Ltd. (JCET), a leading Chinese semiconductor packaging assembly and test company in the Jiangsu Province of China. The newly installed system is equipped with a Pin Scale 1600 digital card, Port Scale RF subsystem and MB-AV8+ analog card to meet JCET’s needs in testing RF-based system-on-chip (SoC) devices and 3G/4G/LTE RF transceivers for mobile phone applications. Ultra Low Noise Power Source for up to 500 mA24 June 2016 – Keysight Technologies introduced a new high current ultra low noise filter for the B2961A and B2962A 6.5 Digit Low Noise Power Source that can supply up to 500 mA while maintaining 10 µVrms and 1nVrms/√Hz (at 10 kHz) noise performance. With a starting price of less than $10K, the B2961A and B2962A are the world’s only low-cost standalone power sources capable of sourcing at ultra-low noise levels. LTE-Advanced RF Conformance Test System23 June 2016 – Anritsu Corporation announced that the ME7873LA LTE-Advanced RF Conformance Test System has achieved world-first Global Certification Forum (GCF) approval for more than 80% test cases supporting the 3 Downlink Carrier Aggregation (3DL CA) RF Conformance Test. Cost-effective Automotive Test Environment22 June 2016 - The magicCAR TC is a modular and scalable test system for a wide range of applications. The miniaturized tester is a cost-effective test environment for development and quality assurance. The combination of simulation and validation components allows flexible use in customer-specific applications. Thanks to the replaceable hardware modules further test resources can be integrated and parallelized easily. This enables a variety of additional applications such as endurance tests, screening tests or parallel tests. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |