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Readers Top 5 News of last 30 days
Latest Test and Measurement NewsPortable OTDR enables fast, precise optical-fibre Characterisation21 October 2014 - The new Yokogawa AQ7280 portable OTDR (optical time-domain reflectometer) delivers the ideal combination of measurement automation, user-friendly operation and reliable performance to enable fast, precise optical-fibre characterisation in the field. The AQ7280 is based on a plug-in modular design that allows it to be configured for a wide range of network environments and topologies from FTTH to metro and core networks.
USB and LAN Power Sensors with widest Dynamic Range20 October 2014 – Keysight Technologies introduced the U2040 X-Series wide dynamic range power sensors, consisting of four USB models for wireless and radar applications, and a dedicated LAN model for satellite testing. With the world’s widest dynamic range found in a power sensor and extremely high measurement speed, the U2040 X-Series makes fast, accurate and repeatable power measurements over a wide range of power levels, allowing engineers to improve productivity and lower cost of test.
PC-controlled VNAs with Coverage up to 40 GHz20 October 2014 – Anritsu expands its ShockLine family of Vector Network Analyzers (VNAs) with the introduction of the MS46122A series. Incorporating Anritsu’s patented shock line VNA-on-a-chip technology, the MS46122A low-cost full-reversing 2-port VNAs are packaged in a very compact 1U chassis, and are optimized for ultra-cost-sensitive test applications in manufacturing, engineering, and education environments.
Advantest Opens VOICE 2015 Call for Papers17 October 2014 – Advantest has issued a VOICE 2015 international call for papers focusing on innovative test solutions for system-on-chip (SoC) and memory semiconductor devices and handler solutions. VOICE, the annual Advantest Developer Conference, will include technical presentations, a partners’ expo, and interactive discussion sessions for users of the V93000 and T2000 SoC test platforms as well as Advantest memory testers, handlers and test cell solutions.
Background: This isn’t your Father’s JTAG anymoreLiterally, IEEE Std. 1149.1 very well might have been your father’s JTAG, since it has been around since 1990. For now over 20 years, this standard has been in use throughout the world (BSDL wasn’t added until 1993). 1149.1 was revised in 2001 with only incremental improvements and no real major rewrites. That is until now. A new 1149.1-2013 and the upcoming release of IEEE Std. P1687, huge changes and unmistakable momentum are on the horizon promising to once again revolutionize the industry.
PXI Signal Analyzer with Swept and FFT Capabilities16 October 2014 – Keysight Technologies announced industry’s first signal analyzer to provide swept and FFT-based capabilities in the PXI form factor. The Keysight M9290A CXA-m PXIe signal analyzer delivers fully specified performance up to 26.5 GHz and provides best-in-class specifications in key areas such as sensitivity and dynamic range.
USB-connected Mixed-Signal Oscilloscopes15 October 2014 - The new PicoScope 3000D Series Mixed-Signal Oscilloscopes (MSOs) form a complete portable test system, with two or four analog channels and sixteen digital channels as well as a built-in arbitrary waveform generator. The PicoScope 3000D Series MSOs are available with analog bandwidths from 60 MHz to 200 MHz. Maximum digital input frequency is 100 MHz, equivalent to a data rate of 200 Mb/s (5 ns pulse width) on each channel. More Articles ...
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