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LTE-A Test Systems supports 3 CC Carrier Aggregation16 May 2014 - Aeroflex announced that the TM500 LTE-A Test Mobile and the E500 Capacity Test System now both support the aggregation of three component carriers (3 CC). Carrier aggregation of 3 CC allows mobile network operators to achieve data rates of up to 450 Mbit/s on their LTE-A networks.
Connecting Boundary-Scan Hardware to VPC Mass Interconnect Systems15 May 2014 - Based on the highly successful QuadPod architecture from JTAG Technologies, the new JTAG/boundary-scan hardware interface product JT 2147/VPC has been specifically designed for connection into G20x or G14x 192 pin ‘QuadraPaddle’ connectors of Virginia Panel (VPC) and is also compatible with the VPC ‘pull thru’ system.
NTi Audio appointed Charles Greene as Sales Manager for UK & Ireland15 May 2014 - Charles Greene, based in Hertfordshire just north of London, strengthens the customer support capability of NTi Audio throughout the UK and Ireland. Charles brings his wealth of experience in sound and vibration instrumentation to NTi Audio having worked for many years with Bruel & Kjaer in Denmark as sound level meter market manager and in the UK as a senior sales engineer. PCI and PXI Programmable Resistors14 May 2014 - Pickering Interfaces is expanding its range of PCI and PXI Programmable Resistors. The existing PCI High-Density Precision Resistor Card (model 50-297) and PXI High-Density Precision Resistor Module (model 40-297) have been expanded to increase the versions offered from 6 to 42; each version offers users the choice of the number of resistor channels, resistance range and the resistance setting resolution.
Measurement and Analysis of Flicker Noise14 May 2014 – Agilent Technologies introduced the Agilent EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer — a next-generation hardware and software system for measurement and analysis of flicker noise and random telegraph noise (RTN). Boundary Scan Technology for In-Circuit Tester of Digitaltest13 May 2014 - GOEPEL electronic announced the extension of the SCANFLEX product group in cooperation with Digitaltest. At the core of the extension is the SFX-TAP6 module for boundary scan integration into the in-circuit-tester (ICT) of the MTS series of Digitaltest The technology allows design validation, hardware debug, production test and programming of Flash and PLDs without use of probes or needles.
Clock Recovery Function for 32Gbit/s Bit Error Rate Tester13 May 2014 - Anritsu released new Clock Recovery options for its MP1800A Signal Quality Analyzer (SQA), providing for Bit Error Rate (BER) testing of high-speed interconnects at up to 32.1Gbit/s with a single instrument. The new Clock Recovery options enable BER measurements and jitter tolerance measurements for clock-less devices and more accurate signal-integrity analyses across a wide range of applications. More Articles ...
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