|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement NewsPortable Logic Analyzers with Deep Memory24 September 2013 – Agilent Technologies introduced its 16850 Series portable logic analyzers. The instruments offer the industry’s fastest timing capture with deep memory for quickly debugging digital systems. The 16850 Series also offers the industry’s only portable logic analyzer with both single-ended and differential probing options to help designers get their high-speed digital devices to market faster. SEMICON Europa to rotate between Dresden and Grenoble23 September 2013 — SEMI, the global trade organization representing the nano- and micro-electronic manufacturing supply chains, announced that next year’s SEMICON Europa will be held in Grenoble, France and alternate with Dresden, Germany in future years to better address pan-European opportunities and challenges in semiconductor design, technology, manufacturing and applications.
Modular Software for easy Development of Baseband and Vector Signals20 September 2013 – Agilent Technologies introduced the M9099 Waveform Creator, a modular software application that supports analog and digital modulation formats, for the Agilent M9381A PXIe Vector Signal Generator. The new software provides a simple, open and expandable environment that increases productivity and speeds time to deployment through superior connectivity with design and modelling software.
Integrated Platform for Software and Hardware Validation and Test19 September 2013 - At the 2013 International Test Conference, GOEPEL electronic, world-class Boundary Scan vendor and iSYSTEM, innovative tool provider for embedded software design announce the market introduction of another new development within the framework of a long-term strategic cooperation for Embedded System Access (ESA) technologies. Comprehensive HIL Test Solutions for electric Motors19 September 2013 - dSPACE introduced an even more flexible and powerful solution for hardware-in-the-loop (HIL) testing of electric motors. Combining the flexible architecture of SCALEXIO with its freely programmable FPGA board DS2655, plus a scalable electronic load, users can test electric motor control systems in a more realistic environment by emulating the real motor and generator currents. CAN-dbc Symbolic Triggering and Differential Active Probes for Oscilloscopes18 September 2013 – Agilent Technologies introduced CAN-dbc symbolic decoding and triggering in its InfiniiVision 4000 X-Series and all Infiniium Series oscilloscopes, along with two differential active probes that are ideal for automotive measurement applications, including Controller Area Network serial buses. CAN buses are used extensively for control and sensor monitoring in automotive applications as well as a broad range of industrial and medical equipment applications.
Tektronix expands Entry Level Oscilloscope Series with 4-Channel Models17 September 2013 – Tektronix announced the expansion of its TBS1000 oscilloscope series to include three new 4-channel models at 60 MHz, 100 MHz and 150 MHz bandwidth. Designed and built by Tektronix, the TBS1000 oscilloscopes are backed by a 5-year warranty for years of reliable electronics testing in research and development, education, service and manufacturing applications. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |