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Latest Test and Measurement NewsKeithley Instruments hosts applications forum16 November 2010 – Keithley Instruments is hosting a forum designed to offer customers and users of Keithley instrumentation a central location for finding product support and exchanging applications insights via the web. The forum is moderated by Keithley instrumentation and applications experts, who are on hand to answer questions and direct forum visitors to sources of additional information, including Keithley application notes and white papers, web seminars, etc. Test Platform for Power Devices15 November 2010 - Advantest Corporation announced two new power device test solutions for its flagship SoC test system, the T2000.The new Integrated Power Device Test Solution (IPS) incorporates a high-power module, a Matrix Module and a High-Voltage Mixed-Signal Module that deliver a comprehensive, configurable solution for "one-stop" test of multifunctional power ICs such as those used in automotive and consumer electronics. Aeroflex launches a new family of signal generators15 November 2010 — The Aeroflex S-Series RF signal generator family makes its worldwide debut at Electronica last week. The S-Series offers simplicity, portability, modularity, and RF performance at an attractive price. The range of instruments has been designed from the ground up to meet the expectations of today’s engineers for instant answers at the touch of a screen. Buttons, rotary controls, and deeply nested software menus have all been removed. EDA Software improves Testbench Quality for BSDL Verification12 November 2010 - GOEPEL electronic introduces TAP Checker a new generation EDA software tool for verification of BSDL (Boundary Scan Description Language) files and validation of JTAG implementations in integrated circuits. The innovative tool suite enables the automatic generation of simulation vectors and test patterns for chip-level validation and verification of IEEE 1149.1 and IEEE 1149.6 compliant implementation. Digital I/Q data recorder stores 1 Tbyte data for analysis of RF signals11 November 2010 - Rohde & Schwarz introduced the R&S IQR digital I/Q data recorder at electronica in Munich. The recorder can record, store and replay digital RF signals loss-free and in realtime over the I/Q interface developed by Rohde & Schwarz. When used in combination with RF scanners, generators and network analyzers from Rohde & Schwarz, the recorder completes a high-performance, continuous analysis system for digital RF signals. LTX-Credence announces Low Cost Analog Test System11 November 2010 - LTX-Credence Corporation announced the introduction of the ASLx, a new test system extending the capabilities of the ASL platform, the successful low cost analog and mixed signal test platform. The next generation in the ASL family, ASLx provides four times the analog and digital pin count and five times the power capability of the ASL1000. First development tool for the emerging IJTAG Standard10 November 2010 - The ASSET ScanWorks platform for embedded instruments has the industry's first toolkit to automate the development of validation and test routines based on the soon-to-be ratified Internal JTAG (IEEE P1687 IJTAG) standard. The beta version of the ScanWorks IJTAG toolkit for developers has already been deployed by two equipment manufacturers and Flextronics, one of the leading electronic manufacturing services (EMS) firms in the world. More Articles ...
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