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Latest Test and Measurement NewsAgilent Technologies Continues Expansion of Source Measure Unit Offering27 October 2010 - Agilent Technologies announced the N6784A 4-quadrant general-purpose source measure unit (SMU), the newest member of the N6700 Modular Power System family. The N6784A SMU offers advanced sourcing and measurement capabilities in four quadrants, required for many general-purpose electronic test applications. Advantest Adopts Galaxy Semiconductor Solutions for Test Data Analysis27 October 2010 - Advantest Corporation and Galaxy Semiconductor Solutions announced that they have entered into a worldwide licensing agreement for Galaxy Examinator(TM), a software package for semiconductor test data analysis. Under the terms of the agreement, Advantest's engineering and applications teams will globally deploy Examinator for STDF format datalog validation, acceptance testing, device characterization and correlation. TÜV SÜD establishes global structures for battery testing26 October 2010 - TÜV SÜD is massively expanding its testing and certification activities for batteries of electrically powered vehicles. TÜV SÜD and its partner Lion Smart are investing several million euros in the construction of a new battery laboratory in Garching near Munich/Germany. The existing testing laboratories in Auburn Hills/USA and Singapore will be simultaneously expanded to the same standard as the laboratory designed for Munich. Under the roof of the recently established TÜV SÜD Battery Testing GmbH, the experts will then offer battery testing based on global safety standards. Pickering Interfaces shows BIRST on LXI devices26 October 2010 - Pickering Interfaces has continued in 2010 to regularly release a steady flow of new products in both the LXI and the PXI platforms. Amongst a variety of products, also the European Launch of BIRST (Built-In Relay Self Test) on LXI devices will be shown at electronica 2010 on Booth A1.530. Simple and Low-cost entry to Boundary Scan Test25 October 2010 - JTAG Live Controller Following the successful launch last year of the highly acclaimed JTAGLive boundary-scan utility tools, JTAG Technologies has further bolstered the hardware interface support by introducing the complementary single TAP IEEE Std. 1149.1 controller - JTAGLive Controller. Scalable Solution to Detect and Measure Perceptual Video Artifacts25 October 2010 –Tektronix announced significant enhancements to the company’s award-winning Sentry digital content monitor making it the only scalable solution that detects video and audio errors in digital programs while generating metrics that correlate to mean opinion scores (MOS). The key to delivering this new video artifact measurement and detection capability through Sentry was the development of a unique set of algorithms that are calibrated against the Tektronix PQA600 Picture Quality Analyzer. Boundary Scan Platform enables Applications with electrical Isolation22 October 2010 - GOEPEL electronic recently introduced TEM/ISO, another new component within the frame of the revolutionary Boundary Scan hardware platform SCANFLEX®. The newly developed TAP Extension Modules (TEM) has been designed particularly for applications in critical signal environments and enables a complete galvanic isolation of the TAP transceiver from the target unit under test. More Articles ...
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