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Readers Top 5 News of last 30 days
News - Board and System TestOmron appointed new Distributor in Poland24 November 2015 - OMRON appointed JSD Polska as new distributor for its AOI solutions in Poland. JSD was founded in 2004 and is based in the Polish capital Warsaw. The company offers a wide range of production equipment for the Polish market and has an extensive install base with outstanding local customer support capability. XJTAG Introduces Live Signal View with Improved Multi-Core Support and Increased Productivity23 November 2015 – XJTAG announced the release of Version 3.4 of its Development System, which introduces major improvements in the visibility into complex systems during all phases of electronic product development and manufacture. A new feature is the Waveform Viewer, which offers a live, correlated view showing the digital signal levels and transitions of acquired JTAG Chain data. Automated MIPI M-PHY Transmitter Test Solution18 November 2015 – Tektronix introduced a fully automated physical layer transmitter test solution for the MIPI M-PHY 3.1 specification and Conformance Test Suite (CTS) 3.1. The solution supports M-PHY High Speed Gears 1, 2 and 3, PWM Mode (G0-G7), and SYS Mode and offers the industry’s lowest noise solution for M-PHY measurements when used with Tektronix DPO70000SX or MSO/DPO70000DX oscilloscopes and P7600 series probes. Ultra-High-Sensitivity, Millimeter-Wave Spectrum Analysis17 November 2015 – Anritsu released the new high performance Fundamental Mode Waveguide Mixer MA2808A, a millimeter-wave measurement option for the Spectrum Analyzer/Signal Analyzer MS2830A. The 60 to 90 GHz MA2808A combines ultimate sensitivity performance with a wide measurement span in an easy-to-use configuration, to enable millimeter-wave measurements that traditional harmonic-mixer and down-converter methods have been unable to achieve. Modular Breakout System for HILS Applications13 November 2015 - Pickering Interfaces, in partnership with OPAL-RT TECHNOLOGIES, have designed a low-cost Modular Breakout System for HILS (Hardware In the Loop Simulation) Applications. The system combines a BoB (Breakout Box) feature set with added flexibility and an FIU (Fault Insertion Unit) chassis. By mating the FIU chassis directly to the BoB, cabling is minimized, creating a more compact reliable design and improving signal integrity. RF shielded Box for testing wireless Devices12 November 2015 - The new R&S TS7124 RF shielded box from Rohde & Schwarz offers the best shielding effectiveness, the largest interior dimensions and the most flexible antenna configurations in its class. It provides reliable, reproducible measurement results in a shielded test environment, especially during the production of wireless devices. Modular Top Down AOI06 November 2015 - Mek (Marantz Business Electronics), has recently launched new additions to its SpectorBOX AOI systems. These include a massive 5 inch camera clearance that enables complete single pass inspection of virtually any assembly. The Mek SpectorBOX modular AOI systems have long been optimized for the inspection of THT components to identify defects such as presence/absence, wrong polarity, color, type, and bent pins. And now, the unique top clearance of 130mm (5.12”) allows the Top-Down SpectorBOX to inspect virtually any completed electronic and electro-mechanical assembly - even when the tallest of components are present. More Articles ...
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