All-about-Test

1. Advantest opens Call for Papers for VOICE 2018 Developer Conference ...: (Component Test); Advantest opens Call for Papers for VOICE 2018 Developer Conference 22 September 2017 – Advantest Corporation issued an international call for papers for the VOICE 2018 Developer Conference focusing ...; Created on 20 September 2017
2. Advantest ships 5,000th V93000 Mixed-Signal Test System ...: (Component Test); Advantest ships 5,000th V93000 Mixed-Signal Test System 15 June 2017 - Advantest has shipped its 5,000th V93000 test system to Integrated Device Technology, Inc. (IDT), a supplier of system-level semiconductor ...; Created on 14 June 2017
3. Advantest Europe and Nash Technologies team for Application Engineering Services ...: (Component Test); Advantest Europe and Nash Technologies team for Application Engineering Services 12 May 2017 – Advantest Europe GmbH and Nash Technologies GmbH announced a strategic partnership to develop solutions ...; Created on 11 May 2017
4. Advantest extends EVA100 Measurement System ...: (Component Test); Advantest extends EVA100 Measurement System 03 March 2017 – Advantest introduced the new HF-AWGD (high-frequency arbitrary waveform generator and digitizer) module to extend the capabilities of its EVA100 ...; Created on 02 March 2017
5. Advantest ships 800th V93000 Port Scale RF Tester ...: (Component Test); Advantest ships 800th V93000 Port Scale RF Tester 27 June 2016 – Advantest has installed its 800th V93000 Port Scale RF test system, with the landmark unit going into the production facility of Jiangsu ...; Created on 26 June 2016
6. Advantest extends EVA100 Product Family with Digital Solution ...: (Component Test); Advantest extends EVA100 Product Family with Digital Solution 11 January 2016 - Advantest introduced the new EVA100 Digital Solution – the latest member in its growing product line of EVA100 measurement ...; Created on 08 January 2016
7. Advantest opens Registration for VOICE 2015 Developer Conference ...: (Component Test); Advantest opens Registration for VOICE 2015 Developer Conference 14 January 2015 – Advantest Corporation will hold its annual VOICE developer conference on May 12-13 at the Hyatt Regency Santa Clara ...; Created on 13 January 2015
8. Advantest extends T2000 Platform with Parametric Measurement Module ...: (Component Test); Advantest extends T2000 Platform with Parametric Measurement Module 17 December 2014 – Advantest has launched a new multi-purpose parametric measurement unit (PMU) module, the T2000 PMU32E, to enhance ...; Created on 17 December 2014
9. Advantest Opens VOICE 2015 Call for Papers ...: (Component Test); Advantest Opens VOICE 2015 Call for Papers 17 October 2014 – Advantest has issued a VOICE 2015 international call for papers focusing on innovative test solutions for system-on-chip (SoC) and memory ...; Created on 17 October 2014
10. Advantest launches System for Semiconductor Packaging Inspection ...: (Component Test); Advantest launches System for Semiconductor Packaging Inspection 03 October 2014 – Advantest announced a new mold thickness metrology system, the TS9000, for measuring the thickness of semiconductor ...; Created on 03 October 2014
11. Advantest introduces new Device Power Supply for T2000 Test Platform ...: (Component Test); Advantest introduces new Device Power Supply for T2000 Test Platform 03 July 2014 – Advantest announced its new T2000 Enhanced Device Power Supply 150A (DPS150AE) module that enables its T2000 test ...; Created on 03 July 2014
12. Advantest entered again 10 BEST List of IC Test Equipment Supplier ...: (Component Test); Advantest entered again 10 BEST List of IC Test Equipment Supplier 09 June 2014 - Advantest Corporation has been named to VLSIresearch’s 10 BEST list for the 26th consecutive year. The ratings are ...; Created on 09 June 2014
13. Advantest introduces Measurement System for Testing Analog, Mixed-Signal and Sensor ICs ...: (Component Test); Advantest introduces Measurement System for Testing Analog, Mixed-Signal and Sensor ICs 30 May 2014 - Advantest Corporation released its new EVA100 measurement system, a value-added platform that ...; Created on 30 May 2014
14. Advantest launches Terahertz Power Meter ...: (News); Advantest launches Terahertz Power Meter 20 May 2014 - Advantest announced the new terahertz power meter TAS5500. This is a basic measurement instrument that computes the strength of terahertz waves ...; Created on 20 May 2014
15. Advantest Introduces new Test Modules for Next-Generation RF-based ICs ...: (Component Test); Advantest Introduces new Test Modules for Next-Generation RF-based ICs 12 March 2014 - Advantest Corporation introduced two new test modules for high-speed, cost-efficient testing of radio-frequency ...; Created on 12 March 2014
16. Advantest launches low-cost Terahertz Spectroscopy System ...: (General T&M); Advantest launches low-cost Terahertz Spectroscopy System 04 February 2014 - Advantest launched its new low-cost, multi-purpose terahertz spectroscopy system, the TAS7400 Series. Based on Advantest’s ...; Created on 04 February 2014
17. Advantest launches Photo Mask Measurement Tool ...: (Component Test); Advantest launches Photo Mask Measurement Tool 27 November 2013 - Advantest Corporation launched its new E3640 MVM-SEM (Multi Vision Metrology Scanning Electron Microscope) tool for measurement of patterns ...; Created on 27 November 2013
18. Advantest to showcase Cloud Testing Platform at SEMICON Europa 2013 ...: (Component Test); Advantest to showcase Cloud Testing Platform at SEMICON Europa 2013 08 October 2013 - Advantest Corporation will showcase its suite of semiconductor solutions, ranging from nanotechnology electron beam ...; Created on 08 October 2013
19. Advantest enters Market for Test of Protocol-Based Flash Storage ...: (Component Test); Advantest enters Market for Test of Protocol-Based Flash Storage 29 July 2013 - Advantest has entered the market for testing advanced PCI Express (PCIe) 3.0 NVMe solid-state drives (SSDs) for enterprise ...; Created on 29 July 2013
20. Advantest develops Terahertz Wave Spectroscopy and Imaging Analysis Platform ...: (General T&M); Advantest develops Terahertz Wave Spectroscopy and Imaging Analysis Platform 20 June 2013 - Advantest Corporation announced that it has developed a terahertz wave spectroscopy and analysis platform, ...; Created on 20 June 2013
21. Advantest launches Production at new Factory in South Korea ...: (Component Test); Advantest launches Production at new Factory in South Korea 23 May 2013 - Advantest Corporation announced that its new factory in Cheonan, South Korea, has been completed. Production of test handlers ...; Created on 23 May 2013
22. Advantest acquires W2BI ...: (Component Test); Advantest acquires W2BI 06 May 2013 - Semiconductor test equipment supplier Advantest and US firm w2bi.com, Inc. (W2BI) have reached an agreement in principle that Advantest will acquire W2BI, a provider ...; Created on 06 May 2013
23. Advantest enters MEMS Testing Market ...: (Component Test); Advantest enters MEMS Testing Market 02 April 2013 - Advantest has entered the high-growth market for testing micro-electromechanical system (MEMS)-based sensors by installing V93000 Smart Scale systems ...; Created on 02 April 2013
24. Advantest VOICE 2013 Conference open for Registration ...: (Newsflash); 19 February 2013 - Registration for VOICE 2013, a user group meeting and partners conference organized by Advantest Corporation, is now open. The event, to be held April 23-25 in San Jose, California, ...; Created on 19 February 2013
25. Advantest expands Application Coverage of Spectroscopic Imaging System ...: (General T&M); Advantest expands Application Coverage of Spectroscopic Imaging System 12 February 2013 - Advantest Corporation has developed two new spectroscopy systems and a new transmittance polarization analysis ...; Created on 12 February 2013
26. Advantest announces VOICE 2013 User’s Conference ...: (Newsflash); 07 December 2012 - Advantest announces seventh annual VOICE 2013 User’s Conference, an international conference focusing on innovative test solutions for system-on-chip (SOC) and memory semiconductor devices ...; Created on 07 December 2012
27. Advantest establishes new Subsidiary Cloud Testing Service, Inc. ...: (Component Test); Advantest establishes new Subsidiary Cloud Testing Service, Inc. 05 October 2012 - Advantest established a new subsidiary to conduct sales of its CloudTesting Service, which provides test solutions ...; Created on 05 October 2012
28. Advantest ships 500th V93000 Port Scale RF Tester ...: (Newsflash); 07 August 2012 - Advantest has installed its 500th V93000 Port Scale RF test system, with the landmark unit going into the engineering development laboratory of Spreadtrum Communications (Shanghai) Co., ...; Created on 07 August 2012
29. Advantest breaks ground for new Factory in Korea ...: (Newsflash); 09 July 2012 - Advantest announced that it broke ground on June 28 for its new factory in Cheonan City, South Korea. The new factory will comprise a two-storey building and a basement area with a total ...; Created on 09 July 2012
30. Hua Hong NEC and Advantest Develop Wafer-Level Test Solution for RFID Devices ...: (Component Test); Hua Hong NEC and Advantest Develop Wafer-Level Test Solution for RFID Devices 02 July 2012 - Shanghai Hua Hong NEC Electronics and Advantest have collaborated to successfully develop a wafer-level, ...; Created on 02 July 2012
31. Advantest plans to launch CloudTesting Service ...: (Newsflash); 21 June 2012 - Advantest Corporation announced that it will launch in fall 2012 a new test solution, dubbed CloudTesting Service (CTS), which utilizes cloud computing technology to offer cutting-edge test ...; Created on 21 June 2012
32. Advantest Ships 100th V93000 Smart Scale Test System ...: (Newsflash); 13 June 2012 - Just ten months after launching its Smart Scale generation of testers, Advantest Corporation has shipped its 100th V93000 Smart Scale system, capable of scalable, highly cost-efficient testing ...; Created on 13 June 2012
33. Advantest announces new Memory Test System ...: (Component Test); Advantest announces new Memory Test System 06 June 2012 - Advantest Corporation announced its new memory test system, the T5811, targeting DRAM memory core test. Available from July 2012, the T5811 ...; Created on 06 June 2012
34. Advantest announces 3D TSV Stack Test Solutions ...: (Component Test); Advantest announces 3D TSV Stack Test Solutions 05 June 2012 - Advantest Corporation announced that a new product line of fully automated and integrated test and handling solutions for TSV based 2.5D ...; Created on 05 June 2012
35. Advantest receives Intel’s Preferred Quality Supplier Award ...: (Newsflash); 24 April 2012 - Advantest Corporation has been recognized as one of 19 companies receiving Intel Corporation’s Preferred Quality Supplier (PQS) award for their performance in 2011. Advantest Corporation ...; Created on 24 April 2012
36. Advantest completes Integration of Verigy ...: (Component Test); Advantest completes Integration of Verigy 05 April 2012 - Advantest Corporation announces the successful completion of integration activities relating to its acquisition of Verigy Ltd. in July 2011. ...; Created on 05 April 2012
37. Verigy Shareholder approved Acquisition by Advantest ...: (Newsflash); 21 June 2011 – Advantest Corporation and Verigy Ltd. announced that the Verigy shareholders have approved the proposed acquisition of Verigy by Advantest. Advantest will acquire all outstanding Verigy ...; Created on 21 June 2011
38. Advantest achieves highest Ratings in annual VLSIresearch Customer Satisfaction Survey ...: (Newsflash); 24 May 2011 – Advantest Corporation announced that it has earned the industry’s top rating for its material handling products in VLSIresearch THE BEST list for customer satisfaction. Advantest also ranked ...; Created on 24 May 2011
39. Advantest to Acquire Verigy ...: (Component Test); Advantest to Acquire Verigy 30 March 2011 – Advantest Corporation and Verigy Ltd. announced that they have entered into a definitive agreement under which Advantest will acquire all outstanding Verigy ...; Created on 30 March 2011
40. Verigy to accept Advantest offer? ...: (Newsflash); ... with its independent financial and legal advisors, unanimously determined that a proposal from Advantest Corporation to acquire all of the outstanding Verigy ordinary shares constitutes a “Superior Offer”. ...; Created on 22 March 2011
41. Advantest to aquire Verigy? ...: (Component Test); Advantest to aquire Verigy? 08 December 2010 – Verigy announced that it has received an unsolicited proposal from Advantest Corporation to acquire all of the outstanding Verigy ordinary shares in cash. ...; Created on 08 December 2010
42. Advantest enhances the T2000 SOC Test Platform ...: (Component Test); Advantest enhances the T2000 SOC Test Platform 02 December 2010 – Advantest Corporation announced three new modules and an infrastructure enhancement, named Enhanced Performance (EP) Package, for the ...; Created on 02 December 2010
43. Advantest Adopts Galaxy Semiconductor Solutions for Test Data Analysis ...: (Component Test); Advantest Adopts Galaxy Semiconductor Solutions for Test Data Analysis 27 October 2010 - Advantest Corporation and Galaxy Semiconductor Solutions announced that they have entered into a worldwide licensing ...; Created on 27 October 2010
44. Advantest and OptimalTest Collaborate to Offer State-of-the-Art Test Management ...: (Component Test); Advantest and OptimalTest Collaborate to Offer State-of-the-Art Test Management 04 October 2010 – Advantest Corporation and OptimalTest announce the availability of OptimalTest’s solutions for totally ...; Created on 04 October 2010
45. Parametric Testing for Developing and Manufacturing Next-Generation ICs: (Component Test); Parametric Testing for Developing and Manufacturing Next-Generation ICs 13 December 2018 – Advantest introduced its new V93000 SMU8 parametric tester to meet chip makers’ process-characterization and ...; Created on 13 December 2018
46. Test of High-Voltage Semiconductors: (Component Test); Test of High-Voltage Semiconductors 04 December 2018 – Advantest Corporation launched a new module for its EVA100 measurement system that enables testing of high-power ICs used in large-volume consumer ...; Created on 04 December 2018
47. Pattern Conversion Software for Cloud-Based Semiconductor Testing: (Component Test); ... and Advantest CloudTesting ServiceTM (CTS), developer of the semiconductor industry’s first on-demand testing service, announced a new software module to convert electronic design automation (EDA) formats ...; Created on 27 November 2018
48. Switching Current Measurement for Memory Test Systems: (Component Test); Switching Current Measurement for Memory Test Systems 15 November 2018 – Advantest announced that a collaboration between the company and Tohoku University’s Center for Innovative Integrated Electronic ...; Created on 15 November 2018
49. Memory Burn-In Testers for Next-Generation NAND Flash Memories: (Component Test); Memory Burn-In Testers for Next-Generation NAND Flash Memories 05 November 2018 – Advantest launched two additional members of its next-generation B6700 family of burn-in memory testers. The new B6700L ...; Created on 05 November 2018
50. Memory Burn-In Tester for NAND Flash and DRAM Devices: (Component Test); Memory Burn-In Tester for NAND Flash and DRAM Devices 15 October 2018 – Advantest announced its next-generation B6700D memory burn-in tester to meet growing global customer demand for server and mobile ...; Created on 15 October 2018

Main Menu

Newsletter

News Area

Info Area

Weblinks

Product Focus

Readers Top 5 News of last 30 days

Related Articles:

Upcoming Events

Tag Cloud

Social Media