Readers Top 5 News of last 30 days
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1.
High-Speed Tester for next Generation LP-DDR5 and DDR5 Memories
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(Component Test)
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High-Speed Tester for next Generation LP-DDR5 and DDR5 Memories
09 April 2018 – Advantest introduced its T5503HS2 memory tester, the industry’s most productive test solution for the fastest memory devices ...
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Created on 08 April 2018
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2.
Stimulus Test Cell for Differential Pressure Sensors
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(Component Test)
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Stimulus Test Cell for Differential Pressure Sensors
22 February 2018 – Advantest launched its HA7300 stimulus test cell, a full capability solution for the testing of differential pressure sensors which ...
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Created on 20 February 2018
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3.
Automated IC Handler with Thermal Control
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(Component Test)
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Automated IC Handler with Thermal Control
14 February 2018 - Advantest developed the M4171 handler to meet the mobile electronics market’s needs for cost-efficient thermal control testing of ICs with ...
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Created on 12 February 2018
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4.
Test of High-Power Analog ICs used in Electric Vehicles
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(Component Test)
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Test of High-Power Analog ICs used in Electric Vehicles
21 December 2017 – Advantest introduced two new modules that enable its T2000 IPS system to test high-voltage and high-power devices used in the ...
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Created on 21 December 2017
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5.
Efficient Testing of Semiconductor Devices
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(Component Test)
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Efficient Testing of Semiconductor Devices
21 November 2017 – Advantest presented the new EVA100 Digital Solution at the Productronica trade show in Munich, Germany, on 14-17 November. The latest member ...
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Created on 20 November 2017
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6.
Advantest opens Call for Papers for VOICE 2018 Developer Conference ...
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(Component Test)
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Advantest opens Call for Papers for VOICE 2018 Developer Conference
22 September 2017 – Advantest Corporation issued an international call for papers for the VOICE 2018 Developer Conference focusing ...
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Created on 20 September 2017
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7.
Massively Parallel Test Fixture for Testing of Display Driver ICs
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(Component Test)
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Massively Parallel Test Fixture for Testing of Display Driver ICs
05 September 2017 - Advantest introduced the RND440 Type 3 fixture, an optional enhancement on its T6391 display driver IC (DDI) tester ...
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Created on 04 September 2017
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8.
Solid-State-Drive Test Solution covers also BIST
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(Component Test)
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Solid-State-Drive Test Solution covers also BIST
25 August 2017 - Advantest has expanded its SSD test coverage with new offerings in the MPT3000 series. With hundreds of systems already installed, the ...
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Created on 20 August 2017
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9.
Testing High-Resolution Converters, Consumer Audio ICs and IoT Devices
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(Component Test)
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Testing High-Resolution Converters, Consumer Audio ICs and IoT Devices
13 July 2017 – Advantest Corporation has added a high-resolution, highly accurate mixed-signal channel card to its Wave Scale MX ...
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Created on 12 July 2017
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10.
Cost-Efficient Wafer-Level Testing of Mixed Semiconductor Memories
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(Component Test)
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Cost-Efficient Wafer-Level Testing of Mixed Semiconductor Memories
04 July 2017 - Advantest launched the T5822 memory tester, the newest member of its T5800 product series, optimized for wafer-level ...
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Created on 03 July 2017
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11.
Advantest ships 5,000th V93000 Mixed-Signal Test System ...
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(Component Test)
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Advantest ships 5,000th V93000 Mixed-Signal Test System
15 June 2017 - Advantest has shipped its 5,000th V93000 test system to Integrated Device Technology, Inc. (IDT), a supplier of system-level semiconductor ...
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Created on 14 June 2017
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12.
Advantest Europe and Nash Technologies team for Application Engineering Services ...
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(Component Test)
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Advantest Europe and Nash Technologies team for Application Engineering Services
12 May 2017 – Advantest Europe GmbH and Nash Technologies GmbH announced a strategic partnership to develop solutions ...
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Created on 11 May 2017
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13.
Advantest extends EVA100 Measurement System ...
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(Component Test)
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Advantest extends EVA100 Measurement System
03 March 2017 – Advantest introduced the new HF-AWGD (high-frequency arbitrary waveform generator and digitizer) module to extend the capabilities of its EVA100 ...
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Created on 02 March 2017
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14.
Pick-and-Place IC Handler for High-Volume Production and Device Characterization
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(Component Test)
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Pick-and-Place IC Handler for High-Volume Production and Device Characterization
08 December 2016 – Advantest Corporation introduced its M4872 pick-and-place handler to improve productivity in testing ...
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Created on 07 December 2016
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15.
Low-Volume Testing of Highly Integrated Modules and System-in-Package (SiP) Devices
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(Component Test)
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Low-Volume Testing of Highly Integrated Modules and System-in-Package (SiP) Devices
23 November 2016 - Advantest launched the new T2000 AiR system, a compact, air-cooled system optimized for low-cost ...
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Created on 22 November 2016
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16.
High-Volume SSD Manufacturing Test
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(Component Test)
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High-Volume SSD Manufacturing Test
16 August 2016 – Advantest Corporation ( introduced the MPT3000HVM system, providing a single platform to test the full range of SATA, SAS, and PCIe solid-state drives ...
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Created on 15 August 2016
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17.
Cost-Effective Testing of RF Semiconductors
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(Component Test)
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Cost-Effective Testing of RF Semiconductors
07 July 2016 - Advantest introduced its Wave Scale generation of channel cards for the V93000 platform, which delivers unprecedented levels of parallelism ...
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Created on 06 July 2016
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18.
Advantest ships 800th V93000 Port Scale RF Tester ...
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(Component Test)
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Advantest ships 800th V93000 Port Scale RF Tester
27 June 2016 – Advantest has installed its 800th V93000 Port Scale RF test system, with the landmark unit going into the production facility of Jiangsu ...
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Created on 26 June 2016
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19.
Die-Level Handling System for KGD Test Strategy
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(Component Test)
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Die-Level Handling System for KGD Test Strategy
14 June 2016 – Advantest Corporation introduced its HA1000 die-level handler, a cost-efficient test solution for determining known good dies (KGD) prior ...
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Created on 13 June 2016
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20.
Cost-Efficient Testing of High-Volume, Cost-Sensitive Flash Memories
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(Component Test)
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Cost-Efficient Testing of High-Volume, Cost-Sensitive Flash Memories
25 April 2016 - Advantest introduced the new T5830 memory tester, the latest member of its T5800 product family, optimized for testing ...
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Created on 24 April 2016
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21.
Universal Analog Pin Module for Testing of Smart Devices
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(Component Test)
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Universal Analog Pin Module for Testing of Smart Devices
01 April 2016 - Advantest has begun shipping its new DC Scale AVI64 module, designed to give the V93000 single scalable platform the broadest ...
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Created on 30 March 2016
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22.
SoC Test Fixture offers 50 Percent more Application Space
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(Component Test)
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SoC Test Fixture offers 50 Percent more Application Space
10 February 2016 - Advantest announced a new RECT550EX HIFIX (High-Fidelity Test Access Fixture) unit to enhance the capabilities of its T2000 ...
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Created on 08 February 2016
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23.
Temperature and Pressure Stimulus Unit for Testing Pressure Sensors
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(Component Test)
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Temperature and Pressure Stimulus Unit for Testing Pressure Sensors
01 February 2016 - Advantest announced the new HA7200 temperature and pressure stimulus unit, designed to apply the precise temperature ...
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Created on 01 February 2016
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24.
Advantest extends EVA100 Product Family with Digital Solution ...
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(Component Test)
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Advantest extends EVA100 Product Family with Digital Solution
11 January 2016 - Advantest introduced the new EVA100 Digital Solution – the latest member in its growing product line of EVA100 measurement ...
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Created on 08 January 2016
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25.
Memory Tester for Universal Flash Storage and PCIe BGA SSDs
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(Component Test)
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Memory Tester for Universal Flash Storage and PCIe BGA SSDs
14 December 2015 - Advantest introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal ...
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Created on 13 December 2015
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26.
High Resolution Error Detection for Advanced ICs
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(Component Test)
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High Resolution Error Detection for Advanced ICs
27 November 2015 - Advantest Corporation initiated sales of its new TDR Option for the company’s TS9000 series of terahertz analysis systems. The new ...
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Created on 25 November 2015
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27.
Production Test of Sensors, Analog and Mixed-Signal ICs
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(Component Test)
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Production Test of Sensors, Analog and Mixed-Signal ICs
20 November 2015 - Advantest introduced the newest model of its EVA100 measurement system, the high-throughput EVA100 Production Model designed ...
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Created on 19 November 2015
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28.
Testing of DRAM Memory ICs with Data Rates up to 16 Gbps
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(Component Test)
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Testing of DRAM Memory ICs with Data Rates up to 16 Gbps
18 August 2015 – Advantest introduced a fast fully integrated memory test card, the HSM16G. The new card extends the high-speed testing capabilities ...
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Created on 17 August 2015
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29.
Flexible and Extendible Solution for SSD Testing
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(Component Test)
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Flexible and Extendible Solution for SSD Testing
13 August 2015 - Advantest offers a new downloadable firmware that enables all MPT3000 systems to test Serial Attached SCSI (SAS) 12G and Serial ATA (SATA) ...
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Created on 11 August 2015
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30.
Integrated Test Solution for Optical Transceivers
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(Component Test)
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Integrated Test Solution for Optical Transceivers
11 June 2015 - Advantest introduced its new 28G OPM (28-gigabit Optical Port Module), the company’s first solution designed specifically for testing ...
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Created on 10 June 2015
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31.
Semiconductor Circuit Analysis using Terahertz Technology
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(Component Test)
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Semiconductor Circuit Analysis using Terahertz Technology
27 May 2015 – Advantest developed a technology utilizing short-pulse terahertz waves for analysis of electrical circuits. The technology has ...
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Created on 26 May 2015
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32.
Advantest opens Registration for VOICE 2015 Developer Conference ...
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(Component Test)
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Advantest opens Registration for VOICE 2015 Developer Conference
14 January 2015 – Advantest Corporation will hold its annual VOICE developer conference on May 12-13 at the Hyatt Regency Santa Clara ...
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Created on 13 January 2015
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33.
Advantest extends T2000 Platform with Parametric Measurement Module ...
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(Component Test)
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Advantest extends T2000 Platform with Parametric Measurement Module
17 December 2014 – Advantest has launched a new multi-purpose parametric measurement unit (PMU) module, the T2000 PMU32E, to enhance ...
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Created on 17 December 2014
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34.
Handler for testing advanced Memory ICs
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(Component Test)
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Handler for testing advanced Memory ICs
11 December 2014 - Advantest Corporation introduced its new M6245 test handler, offering industry-leading productivity with minimal downtime by incorporating ...
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Created on 11 December 2014
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35.
Tester for Display Driver Semiconductors used in High-Resolution LCD Panels
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(Component Test)
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Tester for Display Driver Semiconductors used in High-Resolution LCD Panels
28 October 2014 – Advantest has launched its new T6391 system for testing next-generation display driver ICs (DDIs) and their ...
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Created on 28 October 2014
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36.
Advantest Opens VOICE 2015 Call for Papers ...
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(Component Test)
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Advantest Opens VOICE 2015 Call for Papers
17 October 2014 – Advantest has issued a VOICE 2015 international call for papers focusing on innovative test solutions for system-on-chip (SoC) and memory ...
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Created on 17 October 2014
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37.
Advantest launches System for Semiconductor Packaging Inspection ...
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(Component Test)
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Advantest launches System for Semiconductor Packaging Inspection
03 October 2014 – Advantest announced a new mold thickness metrology system, the TS9000, for measuring the thickness of semiconductor ...
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Created on 03 October 2014
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38.
Engineering Test Station for Solid-State Drives (SSDs)
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(Component Test)
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Engineering Test Station for Solid-State Drives (SSDs)
18 August 2014 – Advantest introduced the next product in its MPT3000 family for testing advanced solid-state drives (SSDs) by launching the flexible ...
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Created on 18 August 2014
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39.
Floating Power Source to test High-Voltage and High-Current ICs
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(Component Test)
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Floating Power Source to test High-Voltage and High-Current ICs
06 August 2014 – Advantest launched its new PVI8 floating power source, which extends the capabilities of its market-leading V93000 test ...
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Created on 06 August 2014
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40.
1.6-Gbps Digital Module enabling Protocol-Aware SoC Testing
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(Component Test)
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1.6-Gbps Digital Module enabling Protocol-Aware SoC Testing
18 July 2014 – Advantest introduced a new T2000 1.6GDM digital module, designed to improve efficiency in testing system-on-chip (SoC) devices ...
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Created on 18 July 2014
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41.
Advantest introduces new Device Power Supply for T2000 Test Platform ...
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(Component Test)
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Advantest introduces new Device Power Supply for T2000 Test Platform
03 July 2014 – Advantest announced its new T2000 Enhanced Device Power Supply 150A (DPS150AE) module that enables its T2000 test ...
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Created on 03 July 2014
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42.
Flexible SSD Test Solution enables Rapid SSD Development and Production Ramp-up
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(Component Test)
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Flexible SSD Test Solution enables Rapid SSD Development and Production Ramp-up
27 June 2014 – Advantest introduced the first member of its NEO-SSD family of products for testing advanced solid-state ...
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Created on 27 June 2014
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43.
Advantest entered again 10 BEST List of IC Test Equipment Supplier ...
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(Component Test)
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Advantest entered again 10 BEST List of IC Test Equipment Supplier
09 June 2014 - Advantest Corporation has been named to VLSIresearch’s 10 BEST list for the 26th consecutive year. The ratings are ...
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Created on 09 June 2014
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44.
Advantest introduces Measurement System for Testing Analog, Mixed-Signal and Sensor ICs ...
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(Component Test)
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Advantest introduces Measurement System for Testing Analog, Mixed-Signal and Sensor ICs
30 May 2014 - Advantest Corporation released its new EVA100 measurement system, a value-added platform that ...
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Created on 30 May 2014
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45.
Integrated Test Cell Using for MEMS-Based Sensors
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(Component Test)
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Integrated Test Cell Using for MEMS-Based Sensors
26 May 2014 - Advantest has installed a fully integrated test cell for final testing of MEMS-based sensors used in tire-pressure monitoring systems ...
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Created on 26 May 2014
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46.
Advantest launches Terahertz Power Meter ...
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(News)
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Advantest launches Terahertz Power Meter
20 May 2014 - Advantest announced the new terahertz power meter TAS5500. This is a basic measurement instrument that computes the strength of terahertz waves ...
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Created on 20 May 2014
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47.
Interview: We offer Test Hardware and Test IP on a Subscription Model
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(Component Test)
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Interview: We offer Test Hardware and Test IP on a Subscription Model
Advantest introduced in September 2013 a new revolutionary semiconductor test solution named CloudTesting. The new concept is ...
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Created on 09 April 2014
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48.
High-Volume Testing of Ultra-Fast SerDes Applications
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(Component Test)
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High-Volume Testing of Ultra-Fast SerDes Applications
04 April 2014 - Advantest Corporation introduced its newest digital channel card, the Pin Scale Serial Link (PSSL) card, for at-speed characterization ...
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Created on 04 April 2014
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49.
Highest Density Power Supply with greater Voltage Range for Semiconductor Test
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(Component Test)
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Highest Density Power Supply with greater Voltage Range for Semiconductor Test
18 March 2014 - Advantest Corporation has extended its V93000 capabilities with the introduction of its new DPS128HV module, ...
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Created on 18 March 2014
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50.
Advantest Introduces new Test Modules for Next-Generation RF-based ICs ...
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(Component Test)
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Advantest Introduces new Test Modules for Next-Generation RF-based ICs
12 March 2014 - Advantest Corporation introduced two new test modules for high-speed, cost-efficient testing of radio-frequency ...
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Created on 12 March 2014
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