All-about-Test

1. Testing High-Resolution Converters, Consumer Audio ICs and IoT Devices: (Component Test); Testing High-Resolution Converters, Consumer Audio ICs and IoT Devices 13 July 2017 – Advantest Corporation has added a high-resolution, highly accurate mixed-signal channel card to its Wave Scale MX ...; Created on 12 July 2017
2. Cost-Efficient Wafer-Level Testing of Mixed Semiconductor Memories: (Component Test); Cost-Efficient Wafer-Level Testing of Mixed Semiconductor Memories 04 July 2017 - Advantest launched the T5822 memory tester, the newest member of its T5800 product series, optimized for wafer-level ...; Created on 03 July 2017
3. Advantest ships 5,000th V93000 Mixed-Signal Test System: (Component Test); Advantest ships 5,000th V93000 Mixed-Signal Test System 15 June 2017 - Advantest has shipped its 5,000th V93000 test system to Integrated Device Technology, Inc. (IDT), a supplier of system-level semiconductor ...; Created on 14 June 2017
4. Advantest Europe and Nash Technologies team for Application Engineering Services: (Component Test); Advantest Europe and Nash Technologies team for Application Engineering Services 12 May 2017 – Advantest Europe GmbH and Nash Technologies GmbH announced a strategic partnership to develop solutions ...; Created on 11 May 2017
5. Advantest extends EVA100 Measurement System: (Component Test); Advantest extends EVA100 Measurement System 03 March 2017 – Advantest introduced the new HF-AWGD (high-frequency arbitrary waveform generator and digitizer) module to extend the capabilities of its EVA100 ...; Created on 02 March 2017
6. Pick-and-Place IC Handler for High-Volume Production and Device Characterization: (Component Test); Pick-and-Place IC Handler for High-Volume Production and Device Characterization 08 December 2016 – Advantest Corporation introduced its M4872 pick-and-place handler to improve productivity in testing ...; Created on 07 December 2016
7. Low-Volume Testing of Highly Integrated Modules and System-in-Package (SiP) Devices: (Component Test); Low-Volume Testing of Highly Integrated Modules and System-in-Package (SiP) Devices 23 November 2016 - Advantest launched the new T2000 AiR system, a compact, air-cooled system optimized for low-cost ...; Created on 22 November 2016
8. High-Volume SSD Manufacturing Test: (Component Test); High-Volume SSD Manufacturing Test 16 August 2016 – Advantest Corporation ( introduced the MPT3000HVM system, providing a single platform to test the full range of SATA, SAS, and PCIe solid-state drives ...; Created on 15 August 2016
9. Cost-Effective Testing of RF Semiconductors: (Component Test); Cost-Effective Testing of RF Semiconductors 07 July 2016 - Advantest introduced its Wave Scale generation of channel cards for the V93000 platform, which delivers unprecedented levels of parallelism ...; Created on 06 July 2016
10. Advantest ships 800th V93000 Port Scale RF Tester: (Component Test); Advantest ships 800th V93000 Port Scale RF Tester 27 June 2016 – Advantest has installed its 800th V93000 Port Scale RF test system, with the landmark unit going into the production facility of Jiangsu ...; Created on 26 June 2016
11. Die-Level Handling System for KGD Test Strategy: (Component Test); Die-Level Handling System for KGD Test Strategy 14 June 2016 – Advantest Corporation introduced its HA1000 die-level handler, a cost-efficient test solution for determining known good dies (KGD) prior ...; Created on 13 June 2016
12. Cost-Efficient Testing of High-Volume, Cost-Sensitive Flash Memories: (Component Test); Cost-Efficient Testing of High-Volume, Cost-Sensitive Flash Memories 25 April 2016 - Advantest introduced the new T5830 memory tester, the latest member of its T5800 product family, optimized for testing ...; Created on 24 April 2016
13. Universal Analog Pin Module for Testing of Smart Devices: (Component Test); Universal Analog Pin Module for Testing of Smart Devices 01 April 2016 - Advantest has begun shipping its new DC Scale AVI64 module, designed to give the V93000 single scalable platform the broadest ...; Created on 30 March 2016
14. SoC Test Fixture offers 50 Percent more Application Space: (Component Test); SoC Test Fixture offers 50 Percent more Application Space 10 February 2016 - Advantest announced a new RECT550EX HIFIX (High-Fidelity Test Access Fixture) unit to enhance the capabilities of its T2000 ...; Created on 08 February 2016
15. Temperature and Pressure Stimulus Unit for Testing Pressure Sensors: (Component Test); Temperature and Pressure Stimulus Unit for Testing Pressure Sensors 01 February 2016 - Advantest announced the new HA7200 temperature and pressure stimulus unit, designed to apply the precise temperature ...; Created on 01 February 2016
16. Advantest extends EVA100 Product Family with Digital Solution: (Component Test); Advantest extends EVA100 Product Family with Digital Solution 11 January 2016 - Advantest introduced the new EVA100 Digital Solution – the latest member in its growing product line of EVA100 measurement ...; Created on 08 January 2016
17. Memory Tester for Universal Flash Storage and PCIe BGA SSDs: (Component Test); Memory Tester for Universal Flash Storage and PCIe BGA SSDs 14 December 2015 - Advantest introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal ...; Created on 13 December 2015
18. High Resolution Error Detection for Advanced ICs: (Component Test); High Resolution Error Detection for Advanced ICs 27 November 2015 - Advantest Corporation initiated sales of its new TDR Option for the company’s TS9000 series of terahertz analysis systems. The new ...; Created on 25 November 2015
19. Production Test of Sensors, Analog and Mixed-Signal ICs: (Component Test); Production Test of Sensors, Analog and Mixed-Signal ICs 20 November 2015 - Advantest introduced the newest model of its EVA100 measurement system, the high-throughput EVA100 Production Model designed ...; Created on 19 November 2015
20. Testing of DRAM Memory ICs with Data Rates up to 16 Gbps: (Component Test); Testing of DRAM Memory ICs with Data Rates up to 16 Gbps 18 August 2015 – Advantest introduced a fast fully integrated memory test card, the HSM16G. The new card extends the high-speed testing capabilities ...; Created on 17 August 2015
21. Flexible and Extendible Solution for SSD Testing: (Component Test); Flexible and Extendible Solution for SSD Testing 13 August 2015 - Advantest offers a new downloadable firmware that enables all MPT3000 systems to test Serial Attached SCSI (SAS) 12G and Serial ATA (SATA) ...; Created on 11 August 2015
22. Integrated Test Solution for Optical Transceivers: (Component Test); Integrated Test Solution for Optical Transceivers 11 June 2015 - Advantest introduced its new 28G OPM (28-gigabit Optical Port Module), the company’s first solution designed specifically for testing ...; Created on 10 June 2015
23. Semiconductor Circuit Analysis using Terahertz Technology: (Component Test); Semiconductor Circuit Analysis using Terahertz Technology 27 May 2015 – Advantest developed a technology utilizing short-pulse terahertz waves for analysis of electrical circuits. The technology has ...; Created on 26 May 2015
24. Advantest opens Registration for VOICE 2015 Developer Conference: (Component Test); Advantest opens Registration for VOICE 2015 Developer Conference 14 January 2015 – Advantest Corporation will hold its annual VOICE developer conference on May 12-13 at the Hyatt Regency Santa Clara ...; Created on 13 January 2015
25. Advantest extends T2000 Platform with Parametric Measurement Module: (Component Test); Advantest extends T2000 Platform with Parametric Measurement Module 17 December 2014 – Advantest has launched a new multi-purpose parametric measurement unit (PMU) module, the T2000 PMU32E, to enhance ...; Created on 17 December 2014
26. Handler for testing advanced Memory ICs: (Component Test); Handler for testing advanced Memory ICs 11 December 2014 - Advantest Corporation introduced its new M6245 test handler, offering industry-leading productivity with minimal downtime by incorporating ...; Created on 11 December 2014
27. Tester for Display Driver Semiconductors used in High-Resolution LCD Panels: (Component Test); Tester for Display Driver Semiconductors used in High-Resolution LCD Panels 28 October 2014 – Advantest has launched its new T6391 system for testing next-generation display driver ICs (DDIs) and their ...; Created on 28 October 2014
28. Advantest Opens VOICE 2015 Call for Papers: (Component Test); Advantest Opens VOICE 2015 Call for Papers 17 October 2014 – Advantest has issued a VOICE 2015 international call for papers focusing on innovative test solutions for system-on-chip (SoC) and memory ...; Created on 17 October 2014
29. Advantest launches System for Semiconductor Packaging Inspection: (Component Test); Advantest launches System for Semiconductor Packaging Inspection 03 October 2014 – Advantest announced a new mold thickness metrology system, the TS9000, for measuring the thickness of semiconductor ...; Created on 03 October 2014
30. Engineering Test Station for Solid-State Drives (SSDs): (Component Test); Engineering Test Station for Solid-State Drives (SSDs) 18 August 2014 – Advantest introduced the next product in its MPT3000 family for testing advanced solid-state drives (SSDs) by launching the flexible ...; Created on 18 August 2014
31. Floating Power Source to test High-Voltage and High-Current ICs: (Component Test); Floating Power Source to test High-Voltage and High-Current ICs 06 August 2014 – Advantest launched its new PVI8 floating power source, which extends the capabilities of its market-leading V93000 test ...; Created on 06 August 2014
32. 1.6-Gbps Digital Module enabling Protocol-Aware SoC Testing: (Component Test); 1.6-Gbps Digital Module enabling Protocol-Aware SoC Testing 18 July 2014 – Advantest introduced a new T2000 1.6GDM digital module, designed to improve efficiency in testing system-on-chip (SoC) devices ...; Created on 18 July 2014
33. Advantest introduces new Device Power Supply for T2000 Test Platform: (Component Test); Advantest introduces new Device Power Supply for T2000 Test Platform 03 July 2014 – Advantest announced its new T2000 Enhanced Device Power Supply 150A (DPS150AE) module that enables its T2000 test ...; Created on 03 July 2014
34. Flexible SSD Test Solution enables Rapid SSD Development and Production Ramp-up: (Component Test); Flexible SSD Test Solution enables Rapid SSD Development and Production Ramp-up 27 June 2014 – Advantest introduced the first member of its NEO-SSD family of products for testing advanced solid-state ...; Created on 27 June 2014
35. Advantest entered again 10 BEST List of IC Test Equipment Supplier: (Component Test); Advantest entered again 10 BEST List of IC Test Equipment Supplier 09 June 2014 - Advantest Corporation has been named to VLSIresearch’s 10 BEST list for the 26th consecutive year. The ratings are ...; Created on 09 June 2014
36. Advantest introduces Measurement System for Testing Analog, Mixed-Signal and Sensor ICs: (Component Test); Advantest introduces Measurement System for Testing Analog, Mixed-Signal and Sensor ICs 30 May 2014 - Advantest Corporation released its new EVA100 measurement system, a value-added platform that ...; Created on 30 May 2014
37. Integrated Test Cell Using for MEMS-Based Sensors: (Component Test); Integrated Test Cell Using for MEMS-Based Sensors 26 May 2014 - Advantest has installed a fully integrated test cell for final testing of MEMS-based sensors used in tire-pressure monitoring systems ...; Created on 26 May 2014
38. Advantest launches Terahertz Power Meter: (News); Advantest launches Terahertz Power Meter 20 May 2014 - Advantest announced the new terahertz power meter TAS5500. This is a basic measurement instrument that computes the strength of terahertz waves ...; Created on 20 May 2014
39. Interview: We offer Test Hardware and Test IP on a Subscription Model: (Component Test); Interview: We offer Test Hardware and Test IP on a Subscription Model Advantest introduced in September 2013 a new revolutionary semiconductor test solution named CloudTesting. The new concept is ...; Created on 09 April 2014
40. High-Volume Testing of Ultra-Fast SerDes Applications: (Component Test); High-Volume Testing of Ultra-Fast SerDes Applications 04 April 2014 - Advantest Corporation introduced its newest digital channel card, the Pin Scale Serial Link (PSSL) card, for at-speed characterization ...; Created on 04 April 2014
41. Highest Density Power Supply with greater Voltage Range for Semiconductor Test: (Component Test); Highest Density Power Supply with greater Voltage Range for Semiconductor Test 18 March 2014 - Advantest Corporation has extended its V93000 capabilities with the introduction of its new DPS128HV module, ...; Created on 18 March 2014
42. Advantest Introduces new Test Modules for Next-Generation RF-based ICs: (Component Test); Advantest Introduces new Test Modules for Next-Generation RF-based ICs 12 March 2014 - Advantest Corporation introduced two new test modules for high-speed, cost-efficient testing of radio-frequency ...; Created on 12 March 2014
43. Test Solution for DDR4 and LPDDR4 Memories with high Throughput: (Component Test); Test Solution for DDR4 and LPDDR4 Memories with high Throughput 07 February 2014 - Advantest Corporation announced its latest test solution for next-generation memory ICs that enable high-demand mobile ...; Created on 07 February 2014
44. Advantest launches low-cost Terahertz Spectroscopy System: (General T&M); Advantest launches low-cost Terahertz Spectroscopy System 04 February 2014 - Advantest launched its new low-cost, multi-purpose terahertz spectroscopy system, the TAS7400 Series. Based on Advantest’s ...; Created on 04 February 2014
45. 64-Channel General Purpose Module for Testing of Power Management ICs: (Component Test); 64-Channel General Purpose Module for Testing of Power Management ICs 20 January 2014 - Advantest Corporation introduced a new 64-channel, general purpose voltage-current (VI) module for its production-proven ...; Created on 20 January 2014
46. Image-Processing Unit for Testing CMOS Image Sensors: (Component Test); Image-Processing Unit for Testing CMOS Image Sensors 20 December 2013 - Advantest Corporation has launched its new T2000 ISS IPE2 unit, significantly shortening the image-processing time needed to test ...; Created on 20 December 2013
47. High-Performance Test Handler for SoC Devices: (Component Test); High-Performance Test Handler for SoC Devices 12 December 2013 - Advantest launched its newest test handler for system-on-chip (SoC) devices, the field-upgradable M4871 pick-and-place system. The handler ...; Created on 12 December 2013
48. Advantest launches Photo Mask Measurement Tool: (Component Test); Advantest launches Photo Mask Measurement Tool 27 November 2013 - Advantest Corporation launched its new E3640 MVM-SEM (Multi Vision Metrology Scanning Electron Microscope) tool for measurement of patterns ...; Created on 27 November 2013
49. Advantest to showcase Cloud Testing Platform at SEMICON Europa 2013: (Component Test); Advantest to showcase Cloud Testing Platform at SEMICON Europa 2013 08 October 2013 - Advantest Corporation will showcase its suite of semiconductor solutions, ranging from nanotechnology electron beam ...; Created on 08 October 2013
50. Advantest enters Market for Test of Protocol-Based Flash Storage: (Component Test); Advantest enters Market for Test of Protocol-Based Flash Storage 29 July 2013 - Advantest has entered the market for testing advanced PCI Express (PCIe) 3.0 NVMe solid-state drives (SSDs) for enterprise ...; Created on 29 July 2013

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