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Readers Top 5 News of last 30 days
News - Component TestHigh Volume Test and Calibration of Barometric Sensors24 February 2015 - Multitest introduced a new MEMS test and calibration solution for barometric sensors. InBaro provides a reliable multisite test and calibration for barometric pressure sensors and gas detection sensors for e.g. 144 and more devices in parallel with a maximum signal count of 2400 pins per insertion. It enables temperature test at a range form – 40°C up to +125°C with high temperature accuracy and stability. Cost-efficient and flexible Solution for Managing Power Dissipation at Test Cells10 February 2015 - The Multitest ATC option for the MT2168 pick-and-place handler offers a cost-efficient and flexible solution for managing low to medium range power dissipation at multisite test cells with up to 16 sites. Multitest ATC is an easy add-on to the standard MT2168, which can be mounted and demounted effortless. Multitest ATC is an affordable, reliable and flexible solution for test development and high volume production. New Version of Automated Characterization Software for WLR and Power Semiconductor Testing09 February 2014 - Keithley released a new version of its Automated Characterization Suite (ACS) software with more support for the development and characterization of semiconductor power devices and wafer level reliability (WLR) testing. Also ACS now supports the Model 2657A High Power Source Measure Unit (SMU) Instrument's ability to source or sink up to 3,000V and the new 10kV Model 2290 Power Supply. Cascade Microtech introduces new Version of Probe Station Control Software06 February 2015 - Cascade Microtech announced Velox 2.0, the latest version of probe station control software. Combining the ease of Nucleus with the power of ProberBench, Velox 2.0 delivers new levels of test and measurement efficiency to accelerate time to job completion.
Advantest opens Registration for VOICE 2015 Developer Conference14 January 2015 – Advantest Corporation will hold its annual VOICE developer conference on May 12-13 at the Hyatt Regency Santa Clara in Silicon Valley, California and May 22 at the Radisson Blu Pudong Century Park in Shanghai, China. VOICE 2015 will include technical presentations, a partners’ expo, and interactive discussion sessions for users of the V93000 and T2000 SoC test platforms as well as Advantest handlers and test cell solutions, offering extensive learning and networking opportunities for all attendees.
PXI-based Semiconductor Tester13 January 2015 – Marvin Test Solutions announced the TS-960, the newest version of its successful TS-900 semiconductor test platform. The TS-960 brings the performance and features of high-end systems to customers at a fraction of the footprint and with outstanding value compared to traditional ATE.
Advantest extends T2000 Platform with Parametric Measurement Module17 December 2014 – Advantest has launched a new multi-purpose parametric measurement unit (PMU) module, the T2000 PMU32E, to enhance its T2000 platform’s capabilities in testing digital, analog and power-management system-on-chip (SoC) devices. The new high-density, 32-channel module is fully compatible with Advantest’s original PMU32 module – even using the same tester interface unit (TIU) – while offering twice the resolution and accuracy. More Articles ...
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