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Readers Top 5 News of last 30 days
News - Component TestMultitest expands Contactor Portfolio for WLP / WLCSP Testing13 January 2016 - Multitest’s new Mercury 030 probe meets the increasing demand for cost-efficient high performance WLP / WLCSP contacting solutions. The Mercury 030 is designed to address the electrical requirements of today's test challenges, without sacrificing mechanical performance in an automated test environment. The Mercury 030 is a WLCSP fine pitch probe made using a Multitest proprietary process that produces a long life, high strength probe with gold plating. For high reliability, stability, and very low contact resistance contacting, the Mercury 030 has two flat surfaces moving in surface-to-surface contact. Advantest extends EVA100 Product Family with Digital Solution11 January 2016 - Advantest introduced the new EVA100 Digital Solution – the latest member in its growing product line of EVA100 measurement systems – for testing a broad variety of digital ICs. Available in both production and engineering models, the new system’s capabilities include design evaluation, front-end and back-end measurements, fault analysis, package verification and acceptance inspection of devices. aps Solutions signs Distributor and Service Agreement with Mechanical Devices Ltd.15 December 2015 - aps Solutions announced an agreement with Mechanical Devices from Israel, an advanced thermal solutions provider, a provider of temperature control systems/solutions that are primarily used by Semiconductor manufacturers to test their devices and wafers at precise selectable temperatures. APS is appointed by MD to their non-exclusive distributor in Germany, Austria and Switzerland. Memory Tester for Universal Flash Storage and PCIe BGA SSDs14 December 2015 - Advantest introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) – memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest’s M6242, high-volume production. High Resolution Error Detection for Advanced ICs27 November 2015 - Advantest Corporation initiated sales of its new TDR Option for the company’s TS9000 series of terahertz analysis systems. The new option enables analysis of circuit quality in semiconductors, printed substrates, electronic components, and other applications, utilizing short-pulse terahertz waves. The solution provides an extremely high spatial precision of less than 5 μm, and a maximum measurement range of 300 mm. Production Test of Sensors, Analog and Mixed-Signal ICs20 November 2015 - Advantest introduced the newest model of its EVA100 measurement system, the high-throughput EVA100 Production Model designed for volume production of sensors, low-pin-count analog ICs and mixed-signal ICs. Fully compatible with the initial EVA100 system introduced last year, the new Production Model allows users to establish a standardized measurement environment from design evaluation through production, dramatically improving their products' time to market. Testing Cable and Filter Transmission Properties10 November 2015 – Anritsu introduces a scalar transmission option for its MS46121A PC-controlled ShockLine 1-port USB Vector Network Analyzers (VNAs) that transforms multiple MS46121A models into a simple scalar system. This new option enables scalar measurements to be made between MS46121A VNAs in either a one-to-one (1 to 1) or one-to-many (1 to n) configuration, creating a flexible and affordable method of conducting magnitude-only transmission measurements for a wide variety of applications, including manufacturing test and student education. More Articles ...
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