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News - Component TestMarvin Test Solutions expands Semiconductor Test Platform12 September 2016 – Marvin Test Solutions expanded the capabilities of its TS-900 PXI semiconductor test platform with the addition of the TS-960e system which offers PXI Express (PXIe) performance and expanded test capabilities for RF devices and SoC applications. The TS-960e builds on the integrated open-architecture of the TS-900 platform and accommodates PXIe and PXI modules - providing high-performance digital, mixed-signal, and RF test capabilities in a compact, single chassis footprint. 2-Serial Contacts Gravity Handler09 September 2016 - aps Solutions GmbH, authorized distributor of Microtec handler products in Europe and Israel, announced the MH245-2CS and MH250-2CS series of Gravity Handlers, which are designed to conduct two testing tasks within one working cycle. It always has been on the wish list of every production test manager to cover two test insertions on one handling system in one run. Measure and Model Device Noise across Wafers24 August 2016 – Keysight Technologies announced the newest release of its high-performance, Advanced Low-Frequency Noise Analyzer (A-LFNA), which is designed to make fast, accurate and repeatable low-frequency noise measurements. The release features a new user interface and tight integration with Keysight’s WaferPro Express software—a platform that performs automated wafer-level measurements of semiconductor devices. PXI based Digital Test Solution for Semiconductor19 August 2016 - National Instruments (NI) announced the NI PXIe-6570 digital pattern instrument and NI Digital Pattern Editor. This product frees manufacturers of RFICs, power management ICs, MEMS devices and mixed-signal ICs from the closed architectures of conventional semiconductor automated test equipment (ATE). High Volume Test of environmental Sensors17 August 2016 - Multitest’s first InHumid test system for final test of environmental sensors was successfully installed at a major European IDM. The Multitest solution allows for high volume single-insertion test and calibration of integrated environmental sensors measuring pressure, temperature, humidity and gas. High-Volume SSD Manufacturing Test16 August 2016 – Advantest Corporation ( introduced the MPT3000HVM system, providing a single platform to test the full range of SATA, SAS, and PCIe solid-state drives (SSDs), from the highest performance enterprise to the most cost-effective client SSDs. The MPT3000HVM achieves this optimal production test solution by leveraging the proven MPT3000 tester-per-DUT (device under test) architecture and unique hardware acceleration in a new high-density configuration. Parameter Analyzer Reduces Characterization Complexity11 August 2016 – Tektronix introduced the customizable and fully integrated Keithley 4200A-SCS parameter analyzer that accelerates semiconductor device, materials and process insights by reducing characterization complexity for new or sporadic users, simplifying test setup, and delivering clear, precise results. Building on the success of the Keithley 4200-SCS parameter analyzer, the new 4200A-SCS instrument features a new graphical user interface and a range of helpful self-learning tools such as expert instructional videos embedded into the instrument. More Articles ...
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