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Readers Top 5 News of last 30 days
News - Component Test100 kHz Handheld LCR Meter with 0.1% Accuracy09 June 2016 - B&K Precision announced the expansion of its current 878B and 879B 40,000-count handheld LCR meters with the addition of a new 100 kHz model, the 880. This new portable LCR meter can measure inductance, capacitance, and resistance with 0.1% basic impedance accuracy. Offering many features typically found only in bench LCR meters, the 880 provides test frequencies up to 100 kHz, selectable test signal levels, and 4-terminal measurement capabilities. USB Type-C Cable Assembly Compliance Testing07 June 2016 – Keysight Technologies announced a new Method of Implementation (MOI) document for cable assembly compliance tests defined in Rev. 1.1 of the USB Type-C specification and Rev. 1.0 of the USB Type-C Compliance Test Specification (CTS). The USB Type-C MOI, together with a test package such as Keysight’s state file, works with the M937xA PXIe multiport vector network analyzer to provide the compliance test solution for USB Type-C cable assemblies. This step-by-step guide of measurement procedures for time and frequency domains simplifies compliance setup and testing. New Kind of Analyzer for Advanced Device Characterization19 May 2016 – Keysight Technologies introduced the world’s first analyzer enabling a minimum of 100-pA level dynamic current measurements with a maximum of 200 MHz bandwidth, 1 GSa/s sampling rate and 14- or 16-bit wide dynamic range. The Keysight CX3300 Series Device Current Waveform Analyzer is a new category of instrument and is ideally suited for researchers struggling with high-speed transient current measurements during advanced device characterization and engineers working to reduce power/current consumption in low-power devices. Pick-and-Place Handler offers advanced Temperature Control Features04 May 2016 - The Multitest MT2168 pick-and-place handler now offers an optional active socket purge (ASP). The ASP completes the portfolio of advanced temperature control features of the MT2168, which include Active Temperature Control (ATC), Cold Test for Characterization on the ambient / hot base handler version and now the ASP. Cost-Efficient Testing of High-Volume, Cost-Sensitive Flash Memories25 April 2016 - Advantest introduced the new T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. As portable applications are booming, the global market for flash-memory test systems is projected to reach $148 million by 2018, according to market analysis firm VLSIresearch. Cost-effectively testing these non-volatile memories requires a versatile platform to enable a high return on investment (ROI) and reduce users’ financial risk. aps Solutions represents Taiwanese Test Handler Manufacturer in Europe06 April 2016 - aps Solutions GmbH (“APS”) announces a representitive and service agreement with Hon. Technologies („HONTECH“), a Taiwanese Test Handler provider focused on fully automated Semiconductor devices backend test applications. HONTECH is ranked in the top three of global test handler manufacturers for MEMS Test, standard Logic IC Test, System Level (Board Level) IC Test, Flash Card IC Test, Precision Chip Automatic Inspection (AOI) and Open-Short Test of strip/substrate & IC packages. Semiconductor Device Modeling and Characterization Software Tool Suite05 April 2016 – Keysight Technologies announced the newest release of its industry-leading device modeling and characterization software suite: Integrated Circuits Characterization and Analysis Program (IC-CAP) 2016, Model Builder Program (MBP) 2016, and Model Quality Assurance (MQA) 2016. The software release provides designers characterizing and modeling semiconductor devices with further advances in modeling and characterization efficiency. More Articles ...
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