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Readers Top 5 News of last 30 days
- 30 May 2018 - Software to simplify Development and Debugging of Automated Test Systems
- 23 May 2018 - Infrastructure for Deployed Systems Management
- 25 May 2018 - Over-the-Air (OTA) Integrated Test Solution for Antenna in Package
- 28 May 2018 - 2x2 MIMO Measurement Function for Evaluation of WLAN Equipment
- 04 June 2018 - PCI Express Test Solution with Multivendor Oscilloscope Support
News - General T&M
Fiber-Optically Isolated High Voltage Probe
25 January 2017 - Teledyne LeCroy announced the new HVFO high voltage fiber-optically isolated oscilloscope probe. The HVFO probe is optimized for measurement of small signals floating on a HV bus in power electronics designs. Optical isolation between the probe tip and the oscilloscope input reduces adverse loading of the device under test (DUT); and also reduces noise, distortion, ringing, overshoots, and transients on the measured signal.
Lock-in Amplifier with optional Quad-PID Feedback Loop
24 January 2017 - Zurich Instruments added the MF-PID option with 4 independent PID (proportional - integral - derivative) controllers to their MFLI, a 500 kHz / 5 MHz lock-in amplifier. The MF-PID option builds on class-leading specifications of the MFLI such as low input noise of 2.5nV/√Hz and a high dynamic reserve of 120 dB. Each controller is seamlessly integrated with the lock-in amplifier, using inputs from a multitude of internal measurement data and analog input signals. The maximum control loop bandwidth is 50 kHz.
High Resolution LXI Digitizers with up to 24 Channels
23 January 2017 - Spectrum GmbH released a range of high-speed 14- and 16-bit LXI-based digitizer products for applications where multiple electronic signals need to be acquired and analyzed. Twelve new instruments with up to 24, fully synchronized channels extend Spectrum's digitizerNETBOX family. The 16-bit ADC models offer sampling rates of either 130 MS/s or 250 MS/s, while the 14-bit units feature sampling rates of 500 MS/s.
NI Automated Test Outlook Reviews Test Approaches Needed in Era of Smart Devices
18 January 2017 – National Instruments (NI) released its Automated Test Outlook 2017. The annual test and measurement report reviews the key technologies impacting automated test environments from reconfigurable test instrumentation to software-centric test platforms and ecosystems for next-generation device test.
EMI Receiver with a DANL of -171dBm/Hz at 1GHz
17 January 2017 - The very fast TDEMI eXtreme (TDEMI X) EMI receivers of GAUSS INSTRUMENTS feature a frequency range from DC to 40 GHz and a 645 MHz CISPR compliant real-time bandwidth, Multi-GHz Real-time Scanning and the lowest displayed average noise level at 40 GHz can now be equipped with an additional ultra-low noise pre-amplifier for the frequency range 30 MHz – 1 GHz. This novel pre-amp provides lowest noise figure and highest dynamic range - both at the same time.
Zurich Instruments and Scribner Associates announce Partnership in Impedance Analysis
16 January 2017 - Zurich Instruments have further strengthened the MFIA Impedance Analyzer with the addition of a ZView-compatible data output format. ZView from Scribner Associates is the world’s most popular analysis software package for Impedance Spectroscopy, offering best-in-class equivalent circuit modeling, and data fitting, manipulation and visualization. The MFIA offers best-in-class accuracy for the acquisition of impedance data, so teaming up with Scribner Associates makes for the perfect match.
Wideband optical Spectrum Analyser
13 January 2017 - Yokogawa launches a high performance wideband optical spectrum analyser. The new AQ6374 is the successor to the Yokogawa and ANDO-branded market-leading AQ6315A wideband optical spectrum analyser. Featuring diffraction grating based monochromator technology delivering high-precision measurement performance and accuracy, an enhanced user interface and an air purging feature, the new instrument offers engineers a powerful benchtop tool for general-purpose optical spectrum measurements over the wavelength range from 350 to 1750 nm.
More Articles ...
- Signal Analysis Solution with 800 MHz Real-Time Bandwidth
- Modular PXIe Digitizers for Wideband Applications
- Digital 100 MHz Multifunction-Oscilloscope
- 5½ Digit High Performance Bench/Portable Multimeters
- High Dynamic Spectrum Measurements for Microwave and Millimeter-Wave Bands
- 100 MHz DSO with 7" Widescreen Display and Standard LAN
- Battery-Drain Analysis Solution
- Volume and Surface Resistivity Measurements
- New 5, 10 and 18 Slot PXIe Chassis
- Network and Spectrum Analysis up to 1.5 THz
- Oscilloscope Probe for Millivolt Signals
- PXI Oscilloscope featuring 14 Bits Resolution and 1 GS/s Sample Rate
- Continuous-Sweep Signal Analysis of Frequencies up to 110 GHz
- Test Probes for Signals up to 18 Gb/s
- Dual Channel 13.6GHz Microwave Signal Generator
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