|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement NewsAt-speed in-system Programming of Flash Memory using IJTAG04 September 2015 – Programming memory in-system, or after the devices have been soldered to a circuit board, is the most efficient method, but the challenge for design and manufacturing engineers has always been the slow speeds of the process. Now, enhancements to ASSET InterTech’s ScanWorks platform for embedded instruments can speed up in-system programming by a factor of 1,000, reducing programming times from 10 or more minutes to one or two seconds. Electro Rent Europe announces Appointment of Key Personnel to UK Office04 September 2015 - Electro Rent Europe, a provider of rental test equipment, announces the appointment of two industry experts to key positions within its new UK office. Mike Sullivan becomes Business Manager, UK, and Stephen Skinner has been appointed Account Manager. The appointments follow the recent opening of Electro Rent Europe's UK office, which will provide customers with localised stock and support. Yokogawa launches enhanced Version of WT300 Power Meter03 September 2015 - Yokogawa introduced an enhanced version of its best-selling WT300 Series of compact 5th generation digital power meters featuring higher accuracy, new measurement functionality and improved connectivity including Modbus/TCP capability to aid integration into production environments. The new WT300E Series has a basic power accuracy of ±0.15% at 50/60 Hz on all measurement ranges - the highest level of accuracy available in any compact power meter – along with a bandwidth of DC and 0.1 Hz to 100 kHz. 7layers extends EMC Test Capabilities with new Full Anechoic Room02 September 2015 - 7layers, a specialist in validating devices and services based on wireless connectivity, has extended its Radio/EMC test capabilities considerably by setting up a new Full Anechoic Room (FAR) in Germany. The new state of the art Full Anechoic Room, which has already been validated, shows excellent shielding and absorption values. This way test projects can run with extremely high accuracy and faster than ever before. High Bandwidth Semiconductor Test Probes01 September 2015 - Everett Charles Technologies (ECT) launched a new member of the versatile ZIP semiconductor test probe family. The Z-080YHJ is designed to meet the many challenges associated with testing High End Digital (HED) devices. ZIP probes are a cost effective solution that provide excellent mechanical reliability and electrical performance. Capturing Functional Compliance Violations on DDR and LPDDR Memories31 August 2015 – Keysight Technologiesintroduced a new software package for use with Keysight logic analyzers, the B4661A memory analysis software. The software offers the industry’s only functional-level compliance violation testing capability across DDR4 and LPDDR4 speed changes. The new B4661A memory analysis software has a performance analysis option that provides powerful new trace overview and navigation features. Noise-Figure, Analog-Demodulation Measurement Applications for Signal Analyzer28 August 2015 – Keysight announced the addition of its proven analog demodulation and noise figure measurement applications as software options to the UXA X-Series signal analyzer. Through the analyzer’s multi-touch user interface, the new software ensures intuitive and efficient operation for engineers creating advanced designs in aerospace, defense and wireless communications. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |