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Readers Top 5 News of last 30 days
Latest Test and Measurement NewsTest System covers all RX in-band Test Cases for LTE FDD 3CC Carrier Aggregation12 May 2015 - The R&S TS8980 RF (pre) conformance test system from Rohde & Schwarz now features all six receiver in-band test cases for LTE FDD carrier aggregation with three downlink component carriers (3CC). Manufacturers of mobile user equipment and chipsets as well as test houses can use this to test 3CC carrier aggregation implementation in accordance with the 3GPP TS 36.101 technical specification. LCR Meter for Cost-Effective Low-Frequency Impedance Testing12 May 2015 – Keysight Technologies introduced three low-frequency options for its E4982A LCR meter. With these new options, the E4982A is well suited for RF inductor, coil and EMI filter manufacturers that are required to perform impedance testing at various frequencies. Today’s smart phones and other electronic equipment often utilize components such as inductors and EMI filters. Ensuring these passive components operate as expected in the real-world requires impedance testing during production, as well as during quality assurance. Highly precise and fast Inspection of Solder and Sinter Pastes11 May 2015 - GOEPEL electronics introduced a new-generation solder paste inspection system. The SPI-Line 3D allows solder pastes and sinter pastes with a height of less than 50 µm to be measured precisely and quickly. The newly developed measuring head, with double-sided projection within the device, provides the maximum degree of repeatability and reliability through its shadow-free inspection. High-speed LXI Digitizers with 8 GSamples On-Board-Memory08 May 2015 - For applications where fast electronic signals in the GHz range need to be remotely acquired and analyzed, Spectrum has extended its popular digitizerNETBOX series of LXI based instruments and released eight new models. Available with two, four or eight fully synchronous channels, the new units feature sampling rates up to 5 GS/s, bandwidth in excess of 1.5 GHz and on-board acquisition memory up to 8 GSamples. USB 2.0 and Power Delivery Protocol Analyzer07 May 2015 – Teledyne LeCroy continues to add support for the new USB Type-C and Power Delivery 2.0 standards with introduction of the Mercury T2C USB Power Delivery and USB 2.0 Protocol Analyzer. The Mercury T2C joins the Teledyne LeCroy USB Voyager M310C, which together provide the USB development community with extensive levels of capability for test, validation and compliance of the emerging USB standards. The USB Type-C and USB Power Delivery 2.0 standards introduce entirely new USB cables and connectors expected to significantly improve user experience. SMH Technologies introduces first PXI In-System Programmer06 May 2015 - SMH Technologies developed the new universal programmer FRPXIA3. FlashRunner FRPXIA3 based on FlashRunner technology, the extremely fast and reliable programming system for Flash-based microcontroller and serial memories is the first in the world programming solution for PXI system with fully hardware and software ATE integration and Multi-target parallel programming channels. Boundary Scan Analyzer supports Intel Microarchitecture Codenamed Skylake05 May 2015 - Keysight announced its Keysight x1149 boundary scan analyzer will expand its coverage capabilities to test the upcoming Intel microarchitecture codenamed Skylake. The Keysight x1149 analyzer is designed to maximize structural test coverage for board designs that incorporate Intel processors. This additional test application for the Intel microarchitecture codenamed Skylake will help electronics designers and manufacturers use the x1149 to test boards with the new microprocessor architecture using boundary scan and Intel Silicon View Technology (Intel SVT). More Articles ...
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