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Latest Test and Measurement NewsTunable Laser Source for Spectral Loss Measurements22 April 2015 – Keysight Technologies introduced the 81606A tunable laser source, a new module for the 8164B lightwave measurement system. With sub-picometer tuning repeatability and best-in-class wavelength accuracy, even in full-speed, two-way sweeps, the new module helps verify the design of demanding devices and reduce test cost per device. The tunable laser speeds up the automated adjustment of wavelength-selective devices and allows test engineers to validate more devices per hour than they can with currently available models. Testing non-scannable Partitions with Boundary Scan21 April 2015 - GOEPEL electronics adds a next generation mixed signal I/O module to the JTAG/Boundary Scan hardware platform SCANFLEX. The new SFX-5296LX offers a powerful solution to make even non-scannable partitions testable through boundary scan. This, for example, allows testing of assemblies with just one Boundary Scan IC. The SFX-5296LX is equipped with diverse dynamic test resources for each channel, such as a frequency counter, an event detector, an arbitrary waveform generator and digitizer. High g Sensor Test Module for Gravity Handler21 April 2015 - Multitest shipped the first “Shaker” 45° high g sensor test module for the MT9928 to a major international IDM. The module allows for a two axis testing with one single stimulation on a flexible and modular handler platform. The well-established “Shaker” module, which was originally available for the MT93xx only, is now also available for the flexible and modular MT9928 gravity handler. Multistandard Test Solution for Bluetooth Prequalification20 April 2015 - The R&S CMW500 wideband radio communication tester of Rohde & Schwarz supports all 38 RF signaling tests designed by the Bluetooth SIG while providing test capability for other cellular and non-cellular standards as well. Thanks to its particularly fast spectrum measurements, the platform helps users optimize their designs. Characterizing all Key Parameters of Semiconductor Power Devices20 April 2015 – Keysight Technologies introduced significant enhancements to the B1505A Power Device Analyzer/Curve Tracer, making it the industry’s only solution able to characterize all key parameters of on-wafer and packaged devices for modern semiconductor power device development. The instrument measures Ciss, Coss, Crss, Gate Charge/Resistance and performs Automatic Thermal Testing. XJTAG releases Update for JTAG Software17 April 2015 – XJTAG, a supplier of boundary scan technology, announced the release of the latest update to its software suite. The focus of this release is on increasing the flexibility of JTAG chain control to make it easier for engineers to access the full JTAG capabilities of their boards and so achieve maximum test coverage. Dynamic chain profiling makes it easier to initialise boards with multiple JTAG chains, in which a device in one JTAG chain controls power supplies or reset lines for JTAG devices in the other chains. Teledyne LeCroy introduces new LabMaster and WaveMaster Oscilloscopes17 April 2015 - Teledyne LeCroy announced significant enhancements to the two highest performance oscilloscope product lines in the company's portfolio. The new LabMaster 10 Zi-A delivers improved performance in effective number of bits and baseline noise along with the industry leading jitter measurement floor. The new WaveMaster 8 Zi-B features increased sample rate, lower noise, enhanced processing capabilities and the latest version of Teledyne LeCroy's advanced oscilloscope user interface, MAUI. More Articles ...
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