|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - Board and System TestCorelis releases new Version of Boundary-Scan Tool Suite13 April 2011 – Corelis, Inc announced the availability of the latest version of its ScanExpress Boundary-Scan Tool Suite. The new Version 7.5 CD accelerates IEEE-1149.6 test development with new automation features. ScanExpress TPG now includes automatic identification and classification of resistors and capacitors involved in IEEE-1149.6 high speed, AC-coupled, and differential circuits. Two Power Sources in One Unit for EMC Tests12 April 2011 - Teseq has released the VAR 3005, a dual voltage supply source controlled by Teseq's NSG 3000 series of EMC test generators. This new supply source not only regulates test voltage, but also generates the reduced voltage for dips and drops testing of EUTs (Equipment Under Test). Combination of Boundary Scan Test and analogue Opens/Shorts Test12 April 2011 - GOEPEL electronic introduced the TIC02/PMU, another TAP Interface Card (TIC) within the frame of the technologically leading JTAG/Boundary Scan hardware platform SCANFLEX. The new module enables the test of peripheral networks in particular for shorts and open connections without powering up the UUT. Using this option, dangerous solder faults can be detected before possibly leading to latent or permanent damages of the integrated circuit when operation voltage is switched on. New Modular Functional Test System for Automotive Electronics07 April 2011 – Agilent Technologies introduced the Agilent TS-8900 Automotive Functional Test System – an off-the-shelf, standardized PXI-based solution that offers unsurpassed test coverage and speed for use in automotive electronics test applications. It is especially suited for testing medium- to high-pin-count electronic control units. ORPRO Vision launches new Benchtop AOI System04 April 2011 - The new Insite B Bench Top AOI combines the performance of ORPRO Vision’s proven technology with the benefits of a small, manually operated, and cost effective system for Post Placement inspection. Insite B is powered by ORPRO Vision’s Novus software, featuring µFlow inspector technology and features a compact, light and rigid Optical Head, capable of supporting up to five high speed, high resolution color cameras. JTAG-based embedded Debugger for Intel x86 Systems01 April 2011 – A new embedded debugger from ASSET InterTech is the first in-system JTAG-based debugger for Intel x86 platforms. Based on ASSET’s ScanWorks platform for embedded instruments, the debugger implements hardware-based run control in system firmware. Once the debugger has been installed, systems can be debugged remotely from anywhere and at anytime with no external JTAG emulator hardware. Precision Power Analyser combines Accuracy with Wideband Performance01 April 2011 - TTid has been appointed by N4L (Newtons4th Ltd.) to provide distributor support in the UK for the new PPA1500 Series of power analysers. The PPA1500 is available as a 1-, 2- or 3-channel model and a frequency range of up to 1 MHz. A calibrated internal shunt with a unique 10x gain mode makes the PPA1500 ideally suited to standby power measurements. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |