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Readers Top 5 News of last 30 days
News - Component TestVerigy and LTX-Credence to Merge19 November 2010 - Verigy and LTX-Credence Corporation announced that they have entered into a definitive merger agreement that would create a semiconductor test company with the scale and presence to provide comprehensive solutions to customers across most major semiconductor market segments. The combined company to be called Verigy, will feature a portfolio of leading semiconductor test systems that address the requirements of the wireless, graphics, computing, automotive, industrial, and entertainment markets. Test Platform for Power Devices15 November 2010 - Advantest Corporation announced two new power device test solutions for its flagship SoC test system, the T2000.The new Integrated Power Device Test Solution (IPS) incorporates a high-power module, a Matrix Module and a High-Voltage Mixed-Signal Module that deliver a comprehensive, configurable solution for "one-stop" test of multifunctional power ICs such as those used in automotive and consumer electronics. LTX-Credence announces Low Cost Analog Test System11 November 2010 - LTX-Credence Corporation announced the introduction of the ASLx, a new test system extending the capabilities of the ASL platform, the successful low cost analog and mixed signal test platform. The next generation in the ASL family, ASLx provides four times the analog and digital pin count and five times the power capability of the ASL1000. New CMOS Image Sensor Test Solution with 64-DUT Parallelism10 November 2010 - Advantest Corporation announced a new CMOS image sensor test solution for its flagship SoC test system, the T2000, which will be available from November. The new solution enables highly accurate and massively parallel testing for CMOS image sensor devices to help customers lower their test cost. Test Solution for High-Speed Interface Devices03 November 2010 - Advantest Corporation announced the availability of its new high-speed interface test solution for its flagship SoC test system, the T2000. The new solution is capable of measurement at speeds up to 12.5Gbps and is enabled by the N6010A Serial Port Parametric Test Module manufactured by Agilent Technologies. Advantest Adopts Galaxy Semiconductor Solutions for Test Data Analysis27 October 2010 - Advantest Corporation and Galaxy Semiconductor Solutions announced that they have entered into a worldwide licensing agreement for Galaxy Examinator(TM), a software package for semiconductor test data analysis. Under the terms of the agreement, Advantest's engineering and applications teams will globally deploy Examinator for STDF format datalog validation, acceptance testing, device characterization and correlation. TÜV SÜD establishes global structures for battery testing26 October 2010 - TÜV SÜD is massively expanding its testing and certification activities for batteries of electrically powered vehicles. TÜV SÜD and its partner Lion Smart are investing several million euros in the construction of a new battery laboratory in Garching near Munich/Germany. The existing testing laboratories in Auburn Hills/USA and Singapore will be simultaneously expanded to the same standard as the laboratory designed for Munich. Under the roof of the recently established TÜV SÜD Battery Testing GmbH, the experts will then offer battery testing based on global safety standards. More Articles ...
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