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Readers Top 5 News of last 30 days
News - Component TestCascade Microtech Reduces Cost-of-Ownership and Delivers Probing Expertise12 October 2010 - Cascade Microtech, Inc. announced new programs to drive down ownership costs and provide customers with increased access to experts in probe technology. In a global response to market requirements to reduce the cost-of-ownership while at the same time meeting the ever-demanding complex probing challenges, Cascade Microtech is implementing three new programs. Advantest and OptimalTest Collaborate to Offer State-of-the-Art Test Management04 October 2010 – Advantest Corporation and OptimalTest announce the availability of OptimalTest’s solutions for totally automated, integrated advanced adaptive test on Advantest’s T2000 High Performance Open Architecture test platform. By enabling T2000 testers and test cells with OptimalTest’s solutions, Advantest will augment the T2000’s industry-recognized high performance and cost benefits for SoC production test with the ability to achieve further significant improvements in yield; early detection of product, process and operational issues; reliability; reduced test time; production quality and Overall Equipment Efficiency (OEE) while keeping test costs low. Software for Semiconductor Test Applications01 October 2010 - Keithley Instruments, Inc. announced a new release of its ACS Basic Edition Semiconductor Parametric Test Software for semiconductor test and measurement applications. ACS Basic Edition Version 1.2 adds new levels of usability, convenience, and productivity in the characterization of component or discrete (packaged) semiconductor devices. It features a Trace Mode that allows an instantaneous check of results and interactively controls voltage sweeps to avoid impending device breakdown. New ASSET ScanWorks toolkit to validate DDR3 memory for Intel platforms29 September 2010 - A new toolkit for ASSET's ScanWorks platform for embedded instruments will allow memory suppliers to thoroughly validate the connectivity of their DDR3 memory chips with certain advanced Intel processors. ASSET InterTech is the leading supplier of open tools for embedded instrumentation. Nordson DAGE launch Next Generation Bond Testing Paragon™ Software24 September 2010 - Nordson DAGE introduces the next generation of its Paragon bond testing software. Paragon is quick and easy to use, providing flexible analysis and guaranteed high accuracy and repeatability of test data by monitoring of all aspects of the Nordson DAGE bondtester. Wafer Edge Profile, Film Edge Metrology and Edge Defect Inspection in One Tool07 September 2010 –KLA-Tencor Corporation, a supplier of process control and yield management solutions for the semiconductor and related industries, announced the latest addition to its industry-leading VisEdge family of products: the VisEdge CV300R-EP edge metrology and inspection tool. B&K Precision Upgrades Handheld LCR Meters26 August 2010 - B&K Precision has enhanced two of its handheld LCR meters. Models 878B and 879B add increased and improved features such as wider measurement ranges as well as higher accuracy and speed, offering more precise and reliable measurements of inductance, capacitance, and resistance. More Articles ...Related Articles: |
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