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News - Component TestAdvantest announces new Memory Test System06 June 2012 - Advantest Corporation announced its new memory test system, the T5811, targeting DRAM memory core test. Available from July 2012, the T5811 reduces power consumption by 90% and floor-space requirements by two-thirds, compared to previous models, and is upgradable via a simple exchange of components. The system will be launched at Advantest’s corporate exhibition, ADVANTEST EXPO 2012, to be held on June 6th - 7th in Tokyo. Advantest announces 3D TSV Stack Test Solutions05 June 2012 - Advantest Corporation announced that a new product line of fully automated and integrated test and handling solutions for TSV based 2.5D and 3D products is under development. The concept model test cell dubbed, DIMENSION, integrates a high parallel test cluster along with singulated die and 3D die stack automated handling capabilities. At the ADVANTEST EXPO 2012 taking place on June 6-7 at the Tokyo International Forum, Advantest will display the concept test cell solution for die handling, test, and production line integration. Cascade Microtech adds new Features to WinCalXE Calibration Software01 June 2011 — Cascade Microtech announced the release of WinCalXE version 4.5 calibration software. WinCalXE 4.5 is a tool for semiconductor engineering and production managers and engineers making on-wafer high-frequency measurements using a Vector Network Analyzer. WinCalXE 4.5 provides accurate, repeatable and precise S-parameter data critical to accurate device characterization. New Handheld Capacitance Meters30 May 2011 - B&K Precision has refreshed its capacitance meter line with updated models 830C and 890C. The 830C measures capacitance up to 200mF and includes an A/C adaptor, while the 890C measures up to 50 mF. Features updated on both models include standard mini USB and cable, improved ergonomic design, upgraded LCD and backlight, and protective screen visor. Energy-saving Testing of Battery Cells27 May 2011 - FuelCon introduces the new battery tester TrueData-EPCD which combines all features of a multi-channel charge / discharge unit with a new and innovative concept for minimizing energy consumption through so-called EPCD technology. The acronym EPCD thereby stands for Energy-Pump-Charging-Discharging. European Distributor of LED and discrete Components Semiconductor Test Solutions24 May 2011 – MPI Corporation (“MPI”) has entered into a strategic agreement with aps Solutions GmbH (“APS”), Germany to represent MPI’s latest test products for the LED and Discrete Semiconductor market in specified countries within the European arena. Probe Card for Wafer-Level Chip-Scale Packages23 May 2011— Cascade Microtech announced the first in the series of Viper probe cards. Viper probe cards will be used for test of high-volume production wafer-level chip-scale packaged devices (WLCSP). Viper’s unique probe pin is integrated into Cascade Microtech’s patented laminated housing technology to deliver consistent and superior electrical results that improve production yields and reduce overall cost-of-ownership. More Articles ...
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