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Readers Top 5 News of last 30 days
News - Component TestParametric Test Solution with “TRUE” Per-Pin Architecture01 March 2018 – Keysight Technologies announced the third generation of its P9000 series massively parallel parametric test system. The system accelerates the fast ramp of new technology and reduces the cost-of-test in the development and manufacturing of advanced semiconductor logic and memory ICs. For example, with the new types of device structure and higher performance, the required amount of parametric test data per advanced technology node (less than or equal to 20 nm) is drastically increasing. Stimulus Test Cell for Differential Pressure Sensors22 February 2018 – Advantest launched its HA7300 stimulus test cell, a full capability solution for the testing of differential pressure sensors which are becoming pervasive in modern automobile designs focused on better fuel economy and green technologies. The HA7300 delivers high-speed, highly precise test temperature control with a proprietary technology that utilizes a heat or cold plate to control the temperature of the sensors under test. Automated IC Handler with Thermal Control14 February 2018 - Advantest developed the M4171 handler to meet the mobile electronics market’s needs for cost-efficient thermal control testing of ICs with high power dissipation during device characterization and pre-production bring up. This portable, single-site handler automates device loading and unloading, thermal conditioning and binning in engineering labs, where most testing today involves manual device handling. Final Test of singulated WLCSPs08 February 2018 - Multitest’s new InWaferX final test solution for singulated WLCSPs addresses the increased quality demand for automotive applications as these quality requirements are expanding to cost sensitive, high volume consumer applications. Based on the production proven InCarrier technology, InWaferX ensures highest efficiency and yield for lowest cost of test. High Density PXI SMU for the Semiconductor Test System25 January 2018 – National Instruments (NI) announced the PXIe-4163 high-density source measure unit (SMU), which provides six times more DC channel density than previous NI PXI SMUs for testing RF, MEMS, and mixed-signal and other analog semiconductor components. The new PXIe-4163 SMU delivers increased DC channel density for higher parallelism in multisite applications and lab-grade measurement quality in a production-ready form factor. Testing Battery Voltage, Resistance, Capacitance, Reactance and more16 January 2018 - B&K Precision announced two new battery analyzers, models BA6010 and BA6011. Both battery analyzers measure voltage and resistance of modern battery technologies with high accuracy, resolution, and speed. Additionally, these instruments provide auxiliary measurement parameters inductance, capacitance, dissipation factor, impedance, quality factor, reactance, and phase angle in degrees and radians. Test of High-Power Analog ICs used in Electric Vehicles21 December 2017 – Advantest introduced two new modules that enable its T2000 IPS system to test high-voltage and high-power devices used in the power trains of electric vehicles (EV/HV). The new enhanced MMXHE (multifunction mixed high voltage) and MFHPE (multifunction floating high power) modules enable massively parallel, high-performance testing by leveraging Advantest’s innovative multifunctional pin design, which allows unprecedented flexibility in assigning test resources to any pin. More Articles ...
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