AI-Powered Requirements-Based Test Creator
- Details
- Board-/System-Test
- 27-03-2026
- 91
26 November 2024 – Pico Technology enhanced its PicoScope 9400 Series by launching the PicoScope 9404A-25, a high-performance oscilloscope offering 25 GHz bandwidth on four channels. This latest addition builds on the existing PicoScope 9400 Series, which features models with 5 GHz and 16 GHz bandwidths, expanding the reach and capabilities of this advanced family of oscilloscopes. Pico Technology's unique Sampler-Extended Real-Time Oscilloscope (SXRTO) technology combines the advantages of traditional real-time acquisition with sampling oscilloscope capabilities, offering engineers the best of both worlds. This means the scope can trigger directly on the signal and can also record pre-trigger data, while also achieving the extremely high time and amplitude resolution of a sampling scope.
25 November 2024 - Saelig Company introduced Aim-TTi’s new FX100 Power Supply Series, the FX100DP and FX100TP models, both of which have two 105W PowerFlex outputs, with a maximum capacity of 42V or 6A. The FX100TP adds a third output from 0-6V and 6A. The 4.3" color touch screen gives the user a clear view and access to a wide range of measurements and features. At the heart of the FX Series is Aim-TTi’s advanced PowerFlex technology, offering an intelligent auto-ranging capability that dynamically adjusts the operating range within the 105W channel power envelope.
22 November 2024 - Keysight Technologies and Analog Devices (ADI), a global semiconductor leader, have collaborated to create a comprehensive test solution for Gigabit Multimedia Serial Link (GMSL2) devices. This partnership focuses on developing Physical Medium Attachment (PMA) test methods and capabilities for the GMSL2 interface, enabling engineers, designers, and manufacturers to produce high-quality, high-performance products that enhance driving safety and support emerging Advanced Driver Assistance Systems (ADAS).
Read more: Keysight and ADI Partner to develop GMSLT Test Methodology
19 November 2024 - After its recent operation in the UK and those in 2023 in the Netherlands, Germany, and Italy, the Microtest Group has arrived in the United States, acquiring Focused Test, one of the few companies worldwide specialized in test systems for SiC and GaN microchips, completing its fifth acquisition in 18 months. The Microtest Group thus consolidates its leadership in test systems and microchip testing, surpassing €80 million in revenue and employing over 400 people.
Read more: Microtest Group acquires Focused Test and enters the U.S. market
18 November 2024 - Chroma has partnered with Altair, and Tron Energy to launch an advanced dynamic battery charge-discharge testing collaboration. The project aims to enable verification and enhancement of battery performance and lifespan through leading-edge equipment and precise simulation technology. It integrates Chroma's Battery Pack Power Hardware-in-the-Loop (HIL) system, Altair's precisely designed vehicle dynamics and battery models, and Tron Energy's real bus operational data to simulate the driving conditions of Tron Energy's electric buses on a test bench, facilitating repeated dynamic charge-discharge and cycling tests.
15 November 2024 - Rigol introduced its new MHO/DHO5000 4/6/8-channel high-resolution digital oscilloscope series, based on Rigol's proprietary Centaurus technical platform. 500MHz and 1GHz models are available in this series. The 1,000,000 wfms/s waveform capture rate, up to 500Mpt memory depth, 12-bit resolution, real-time sample rate of up to 4GSa/s, together with an excellent noise floor, all address the test demands for high accuracy situations. Vertical sensitivity provided is down to 100μV/div.
Read more: 12-bit digital Oscilloscope Series with 4/6/8 Channels
14 November 2024 - Keysight Technologies introduced a 4881HV High Voltage Wafer Test System, expanding its semiconductor test portfolio. The solution improves the productivity of power semiconductor manufacturers by enabling parametric tests up to 3kV supporting high and low-voltage in one-pass test. Manufacturers have traditionally measured wafers using separate testers for high and low voltages. However, demand for power semiconductors is rapidly growing due to their multifunctionality, higher performance, and next-generation devices such as silicon carbide (SiC) and gallium nitride (GaN).
Read more: High Voltage Wafer Test System for Power Semiconductors
Page 48 of 62