AI-Powered Requirements-Based Test Creator
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- 27-03-2026
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05 November 2024 - With the digital H-field probe BFD-400-1 the engineers at Narda Safety Test Solutions have achieved a breakthrough in the isotropic measurement and analysis of low-frequency magnetic fields. On the FieldMan, Narda's smart and intuitive EMF broadband measuring device, it reliably and safely records and evaluates the field exposure of employees in areas such as automotive, railroad and other industrial applications at frequencies between 1 Hz and 400 kHz.
04 November 2024 – Anritsu and Bluetest have combined their recent product upgrades to create an Over-the-Air (OTA) measurement solution in a MIMO environment for verifying RF performance in the tri-frequency bands of the latest WLAN standard (IEEE 802.11be). This collaboration enables transmit power (Total Radiated Power, TRP) and receiver sensitivity (Total Isotropic Sensitivity, TIS) measurements in a 2x2 MIMO environment on devices supporting IEEE 802.11be.
Read more: MIMO OTA Measurements on IEEE 802.11be (Wi-Fi 7) Devices
01 November 2024 - OMRON launched the VT-X950, the latest model in its lineup of CT-type automatic X-ray inspection systems. The VT-X950 joins the VT-X750-XL and VT-X850, expanding OMRON’s offerings of high-speed 3D inspection systems. These systems are designed to meet the increasingly complex demands of semiconductor manufacturing and other advanced industries. The VT-X950 stands out as the first model in the VT series specifically designed to support clean rooms, making it ideal for mid-process semiconductor environments, such as wafer-to-wafer bonding processes.
Read more: OMRON launched 3D-AXI Automated X-Ray Inspection System
31 October 2024 - Using the new PCIe flagship AWG cards from Spectrum Instrumentation and cost-effective COTS (Commercial-of-the-shelf) PC-parts, it is possible to generate nearly any waveform with up to 10 GS/s output rates, 2.5 GHz bandwidth and 16-bit vertical resolution. The new cards make a powerful alternative to benchtop AWGs that often face a bottleneck when loading data for new waveforms. The cards offer a massive onboard memory of up to 8 GigaSamples (16 GB) and the possibility to stream data at up to 10 GigaBytes per second directly from CPUs or even GPUs. Four different models make up the M5i.63xx AWG series, offering a perfect fit solution for every application.
Read more: AWG Cards generate Waveforms with 10 GS/s and 2.5 GHz Bandwidth
30 October 2024 - For the efficient analysis of the timing behavior of ECUs, Vector and PLS Programmierbare Logik & Systeme now offer a new free timing bundle which can be used to identify and eliminate timing problems in early project phases. Currently, the TriCore and AURIX microcontroller families from Infineon are supported. The timing bundle for PLS’ UDE Universal Debug Engine is based on the Vector ECU basic software MICROSAR Classic and the TA Tool Suite and is available from Vector. The UDE takes over the task of convenient and precise tracing directly on the ECU hardware.
Read more: Timing Bundle simplifies Runtime Analysis of ECUs
29 October 2024 - Keysight Technologies expanded its regenerative power system series with two new models, supporting power options of 20kW and 30kW at 500V. In addition, the release is enhanced with power priority that allows users to program the output power seamlessly across the zero point when transitioning between positive and negative. As electric vehicles (EVs) and renewable energy systems continue to evolve, the demand for robust testing equipment is increasingly critical. The 500V models enable engineers to implement higher current and power solutions to support a wider range of applications, including battery-powered solutions in agriculture, residential energy storage, and compact transportation such as e-scooters, e-bikes, and motorcycles.
28 October 2024 – Test Research, Inc. (TRI) announces the release of the high-throughput 3D SEMI CT AXI TR7600 SIII Plus, specifically designed for high-reliability electronics manufacturing, including the Semiconductor and Advanced Packaging industries. Equipped with a Multi – High-Resolution configuration 2 µm - 20 µm, the TR7600 SIII Plus is an optimal addition to high-reliability electronics manufacturing industries such as Automotive, Aerospace, and Medical. The TR7600 SIII Plus delivers High-Speed Inspection tailored to the throughput requirements of OSATs (Outsourced Semiconductor Assembly and Test providers) and integrates AI-Powered Inspection Algorithms, including AI-Void Detection and AI Repair Station to enhance defect detection rates.
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