04 October 2024 – Viavi Solutions presented a new optical connector inspection solution for next-generation transceivers. The FVAM-2000 is the latest addition to the company’s benchtop microscopy line and, along with other new optical and Ethernet testing solutions, was on display at VIAVI Stand during ECOC 2024, September 23-25 in Frankfurt, Germany. ECOC is Europe’s largest exhibition in the optical communication technology industry.
03 October 2024 — On the path to 6G, it is important to create terahertz (THz) transmission sources that offer high signal quality, and that cover as wide a frequency range as possible. Combining optical technologies with electronics is one possible way to achieve this in the future. At EuMW 2024 in Paris, Rohde & Schwarz showed the company’s contribution to state-of-the-art THz research within the 6G-ADLANTIK project. This project focuses on developing components for the THz frequency range based on photonic and electronic integration. Such THz components, yet to be developed, can then be used for innovative measurements and faster data transfers.
02 October 2024 - The new Release 9 of Vector DYNA4 includes preconfigured virtual test drive scenarios for AEB and FCW functions according to Euro NCAP 2023, including automated evaluation as specified in the test protocols. The NCAP test maneuvers are completely implemented in the ASAM standard OpenSCENARIO XML and can be executed directly in DYNA4. In addition, Vector makes them available free of charge as open-source downloads on Github. The new release also simplifies the use of ASAM OSI, e.g. making it easier to connect external sensors or ADAS driving functions.
01 October 2024 - GOEPEL electronic is expanding its portfolio of Test Access Port (TAP) Interface Cards (TIC) with two new modules. The plug-in variant SFX II TIC01/VX and the external add-on variant SFX II TIC422/S(R) will be on display for the first time at electronica 2024 in Munich. Both modules are designed for operation with SFX II CUBE, SFX II BLADE, and SCANBOOSTER II controllers and are compatible with previous TIC variants.
Read more: Boundary Scan Test Modules with programmable Output Voltage
30 September 2024 - Keysight Technologies announced the launch of its N7718C Optical Reference Transmitter. This advanced solution is a critical tool for testing optical receivers engineered for 200G-per-lane transmission. The widespread adoption of artificial intelligence and machine learning (AI/ML) across various industries has greatly increased pressure on data center throughput. As the demand for higher data rates continues to surge, manufacturers of optical transceivers and optical interconnect solutions face increasing pressure to comply with emerging standards such as IEEE 802.3dj. The Optical Reference Transmitter arrives at a critical juncture, offering a solution for compliance validation and interoperability assurance at data rates exceeding 200Gbit/s per lane.
Read more: Optical Reference Transmitter to validate Next-Generation Data Transmission
27 September 2024 - dSPACE launched an efficient test solution that can be used to perform high-precision separation and interference tests on automotive radar sensors. The system makes it possible to transfer previously time-consuming tests to a controlled laboratory environment and helps speed up the development of reliable and safe advanced driver assistance systems, which are increasingly integrating radar technologies.
Read more: Radar Test Solution for Separation and Interference Tests
26 September 2024 – Emerson expanded its NI USB data acquisition (DAQ) product line with the new NI mioDAQ device. Emerson’s NI mioDAQ bus-powered USB DAQ device features up to 16 channels of 20-bit resolution and delivers 1 million simultaneous samples per second. It was built for optimal performance, offering improved measurement capabilities, simplified setup and upgraded software. Its modern mechanical design and USB type-C connectivity simplify setup and increase accessibility to engineering teams. This capability enables engineers to debug complex designs early in the development cycle, significantly reducing costs.
Read more: USB Data Acquisition Device with 20 Bit Resolution
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