|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - Board and System TestBER Test Solution supports PAM-406 August 2015 – Keysight Technologies expanded its PAM-4 measurement solutions with support for PAM-4 data formats and built-in error counters on the M8000 Series BER test solutions. PAM-4 support and the ability to integrate a device’s built-in error counter helps R&D and test engineers characterize and test high-speed digital receivers for the data-center networking, storage and computer industries. First Lab in Europe for Wi-Fi CERTIFIED Wi-Fi Aware Certification Testing05 August 2015 – CETECOM opened the first lab in Europe to perform certification testing of new Wi-Fi CERTIFIED Wi-Fi Aware program of Wi-Fi Alliance. The Wi-Fi Alliance has launched the Wi-Fi CERTIFIED Wi-Fi Aware certification program, offering an exciting new capability of Wi-Fi which enables power-efficient discovery of nearby devices, applications, and information before making a Wi-Fi connection. Multifunctional Test Generator for Transient Testing03 August 2015 - EM Test introduced the compact multifunctional test generator NX5 that meets international and product-specific transient and power fail requirements, including EFT/burst to 5.5 kV, surge to 5.0 kV and power fail testing. An intuitive 7" touch screen panel is the gateway to customized sequences and testing. Defined keys indicated by LED, such as start, stop and break, allow the user to run the individual configured tests quickly and accurately. Automated and intuitive ECU Testing30 July 2015 - AutomationDesk, the test automation software from dSPACE, brings numerous innovations with the release of its latest version, AutomationDesk 5.0. The new version significantly modernizes how ECU testing is performed. Its new signal-based test description makes it possible to quickly create and execute clear, intuitive tests. New features of AutomationDesk 5.0 enable efficient testing of complex camera-based advanced driver assistance systems (ADAS). eBook explains extrem fast In-system Flash Programming via IJTAG29 July 2015 – New faster methods for the in-system programming of onboard flash as well as I2C and SPI memory are explained in a new eBook published by ASSET InterTech. Advanced programming methods based on the IEEE 1687 Internal JTAG (IJTAG) standard and embedded programming engines in an onboard FPGA can accelerate programming speeds by a factor of 1,000, shortening the process from tens of minutes to a second or less. Boundary Scan Test for non scanable Partitions28 July 2015 - GOEPEL electronics presents with CION-LX Module/FXT48A a new Boundary Scan module. It offers a wide function range and dynamics for test of analog, digital and mixed signals. The module is an easy, safe and low cost solution to extend the Boundary Scan technology to non scanable partitions. The CION-LX Module/FXT48A has 48 single-ended and 6 differential channels covering a voltage range between 0,9V and 3,6V. Wireless Test Set supports new WLAN 802.11ah and 802.11af24 July 2015 – Keysight Technologies announced new WLAN 802.11ah and 802.11af capabilities for the EXM wireless test set. The EXM now supports more Internet-of-Things (IoT) wireless devices and formats in the design validation and manufacturing stages of product development. In addition, the technologies expand the test set’s existing broad multi-format coverage of wireless connectivity, cellular formats and development. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |