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News - Component TestAgilent enhances Parameter Analyzer with more Capabilities05 June 2013 – Agilent Technologies announced source/monitor unit (SMU) and software enhancements to its B1500A semiconductor parameter analyzer. The new B1514A 50-µs pulse medium-current SMU gives a faster pulse at 30V/1A range plus oscilloscope-like viewing. The new B1511B medium-power SMU delivers 0.1 fA low-current measurement capability at a lower price with an optional atto-sense switch unit. Advantest launches Production at new Factory in South Korea23 May 2013 - Advantest Corporation announced that its new factory in Cheonan, South Korea, has been completed. Production of test handlers - used in conjunction with testers in semiconductor manufacturing - began last week. The new factory boasts a monthly production capacity of 80 test handlers and 40 probe cards. KLA-Tencor announces novel Defect Discovery and Monitoring Technology17 May 2013 - KLA-Tencor announced NanoPoint, a new family of patented technologies for its 2900 Series defect inspection system. NanoPoint represents an entirely new way to discover and monitor defects, at optical speed and on existing optical defect inspection equipment. NanoPoint's value has already been demonstrated on early metal layers, where line-edge roughness (LER) on dense pattern had previously limited the ability to detect tiny yield-killing defects inline at advanced nodes. Four-Channel high Voltage Instrument for Analog Test System16 May 2013 – LTX-Credence introduces the VSX four-channel multisite high voltage source and measure instrument for its low cost analog test system ASLx. Specifically designed for the challenging high voltage stress and breakdown tests required in today's growing power device market. It can source up to 1250V, for coverage of the majority of high voltage testing needs. Kelvin Contactor for High Power Applications proves Performance06 May 2013 - Multitest announces that its ecoAmp high power Kelvin contactor successfully passed a challenging evaluation for an automotive application at a European based IDM. The patent pending ecoAmp is a solution for high-power applications of 1000+ amperes. The ecoAmp specifically responds to the challenging requirements of high voltage/high current test. Advantest acquires W2BI06 May 2013 - Semiconductor test equipment supplier Advantest and US firm w2bi.com, Inc. (W2BI) have reached an agreement in principle that Advantest will acquire W2BI, a provider of system level test automation software focusing on wireless communications. Based in New Jersey, W2BI will become a fully-owned subsidiary of Advantest’s US subsidiary, Advantest America, Inc. The acquisition is scheduled for finalization in May 2013, pending the completion of all required procedures. Multitest presents a new Contacting Unit Holder19 April 2013 - Multitest, a designer and manufacturer of final test handlers, announces the new Access+ contact unit holder (CUH) for the MT9510 test handler. The Access+ CUH has been developed for quick and easy access to the contactors, centering plate and adapter board. The number of fixtures to open has been reduced by more than 80 percent. The new design substantially simplifies the demounting and mounting of the CUH Access+ reduces the time for maintenance on the test floor and directly improves cost of test and return on investment. More Articles ...
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