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News - Component TestAdvantest extends EVA100 Measurement System03 March 2017 – Advantest introduced the new HF-AWGD (high-frequency arbitrary waveform generator and digitizer) module to extend the capabilities of its EVA100 measurement platform to include high-resolution and high-speed analog devices. With the new module, the EVA100 system can measure all key parameters of mixed-signal, precision and standard analog semiconductors used in high-growth applications including on-board automotive electronics. Sensor Test Module for Twin Axis Stimulation22 December 2016 - Multitest shipped a new “Shaker” high g sensor test module for the MT9928. The module allows for twin axis testing in one stimulation on the x and z axis. The module expands the MEMS/sensor test portfolio for the flexible and modular MT9928 handler platform, which already includes multiple solutions for test and calibration of inertial MEMS/sensors. High Multi-Site Test of Pressure Sensors12 December 2016 - Xcerra recently shipped a complete test cell for pressure test, which combines the new InPressure HD module for high pin count pressure test up to 16 bar with an LTX-Credence Diamondx tester, a Multitest InStrip test handler, Xcerra test interfaces and a third party pressure supply unit. In addition to the hardware, Xcerra developed the test program and provided full integration and validation services. Pick-and-Place IC Handler for High-Volume Production and Device Characterization08 December 2016 – Advantest Corporation introduced its M4872 pick-and-place handler to improve productivity in testing system-on-chip (SoC) devices in high-volume manufacturing (HVM) and device characterization pre-production environments. This helps users to keep pace with the rapidly changing SoC market and quickly adapt to changes in device technology. Testing the transmission Quality of high-speed Link Cables06 December 2016 - The GCAT Gigabit Cable Tester from GOEPEL electronic is a new tool for evaluation of the transmission quality of serial high-speed cables. Thereby production losses can be reduced. Previously available cable testers often only execute a simple connection test (Go / NoGo Test). Thanks to the modular adapter principle, any cable type can be tested. The integrated FPGA (Field Programmable Gate Array) and its test mechanisms are specifically designed for a BERT (Bit Error Rate Test). Low-Volume Testing of Highly Integrated Modules and System-in-Package (SiP) Devices23 November 2016 - Advantest launched the new T2000 AiR system, a compact, air-cooled system optimized for low-cost testing in R&D and high-mix, low-volume production. Shipments to customers are expected to begin in the first quarter of calendar year 2017. The T2000 AiR extends the capabilities of the established T2000 platform to serve the testing needs of IDMs, foundries and fabless semiconductor companies making IoT-enabled devices. Pick and Place Handler for small Packages below 3 x 3 mm10 November 2016 - Multitest expanded the package range for both pick and place handler platforms - the MT9510 and MT2168 - to devices smaller than 3 x 3 mm. The expanded package portfolios of the MT9510 and MT2168 exceed the typical ranges of competitive pick and place systems. More Articles ...
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